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Results for complex event processing

Publications & Outputs

  1. Complex Patterns of Failure: Fault Tolerance via Complex Event Processing for IoT Systems

    Power, A. & Kotonya, G., 21/10/2019, Proceedings - 2019 IEEE International Congress on Cybermatics: 12th IEEE International Conference on Internet of Things, 15th IEEE International Conference on Green Computing and Communications, 12th IEEE International Conference on Cyber, Physical and Social Computing and 5th IEEE International Conference on Smart Data, iThings/GreenCom/CPSCom/SmartData 2019. IEEE, p. 986-993 8 p. 8875363

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  2. A Microservices Architecture for Reactive and Proactive Fault Tolerance in IoT Systems

    Power, A. & Kotonya, G. O., 31/08/2018, 2018 IEEE International Symposium on a World of Wireless, Mobile, and Multimedia Networks (WoWMoM) . IEEE, p. 588-599 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  3. Scalable dynamic business process discovery with the constructs competition miner

    Redlich, D., Molka, T., Gilani, W., Blair, G. S. & Rashid, A., 2014, Proceedings of the 4th International Symposium on Data-driven Process Discovery and Analysis (SIMPDA 2014), Milan, Italy, November 19-21, 2014.. Accorsi, R., Ceravolo, P. & Russo, B. (eds.). p. 91-107 17 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  4. Event-Driven Process-Centric Performance Prediction via Simulation

    Redlich, D. & Gilani, W., 29/08/2011, Business Process Management Workshops - BPM 2011 International Workshops: Clermont-Ferrand, France, August 29, 2011, Revised Selected Papers, Part I. Daniel, F., Barkaoui, K. & Dustdar, S. (eds.). Berlin: Springer, p. 473-478 6 p. (Lecture Notes in Business Information Processing; vol. 99).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review