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Keywords

subsurface imaging, 3D imaging, cross-sectional polishing, BEXP, beam exit cross-sectional polishing, ultrasonic fore microscopy, UFM, AFM, SEM, Nanotechnology

Novel materials-analysis technique promises to reduce costs of high-tech manufacturing

Press/Media: Research

Period	1/04/2014

Physics

Associated organisational units

References

Title	Novel materials-analysis technique
Degree of recognition	International
Media name/outlet	News www.myscience.org.uk
Media type	Web
Duration/Length/Size	London, UK
Date	1/04/14
Persons	Manus Hayne, Oleg Kolosov, Alexander Robson