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Cyber Security Research Centre (Software Engineering)

  1. 2019
  2. Published

    Automatically Identifying Code Features for Software Defect Prediction: Using AST N-grams

    Shippey, T., Bowes, D. & Hall, T., 02/2019, In: Information and Software Technology. 106, p. 142-160 19 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  3. 2018
  4. Published

    Authors' reply to 'comments on 'researcher bias: The use of machine learning in software defect prediction''

    Shepperd, M., Hall, T. & Bowes, D., 1/11/2018, In: IEEE Transactions on Software Engineering. 44, 11, p. 1129-1131 3 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  5. Published

    How Effectively Is Defective Code Actually Tested? An Analysis of JUnit Tests in Seven Open Source Systems

    Petric, J., Hall, T. & Bowes, D., 10/10/2018, Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York, NY, USA: ACM, p. 42-51 10 p. (PROMISE'18).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  6. Published

    Mining communication patterns in software development: A GitHub analysis

    Ortu, M., Hall, T., Marchesi, M., Tonelli, R., Bowes, D. & Destefanis, G., 10/10/2018, PROMISE'18 Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York: ACM, p. 70-79 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  7. Published

    Code cleaning for software defect prediction: A cautionary tale

    Shippey, T., Bowes, D., Counsell, S. & Hall, T., 29/08/2018, 2018 44th Euromicro Conference on Software Engineering and Advanced Applications (SEAA). IEEE, p. 239-243 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  8. Published

    Reproducibility and replicability of software defect prediction studies

    Mahmood, Z., Bowes, D., Hall, T., Lane, P. C. R. & Petrić, J., 1/07/2018, In: Information and Software Technology. 99, p. 148-163 16 p.

    Research output: Contribution to Journal/MagazineReview articlepeer-review

  9. Published

    Software defect prediction: do different classifiers find the same defects?

    Bowes, D., Hall, T. & Petrić, J., 1/06/2018, In: Software Quality Journal. 26, 2, p. 525-552 28 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  10. Published

    The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract)

    Kirbas, S., Caglayan, B., Hall, T., Counsell, S., Bowes, D., Sen, A. & Bener, A., 2/04/2018, 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 471 1 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  11. 2017
  12. Published

    Assert use and defectiveness in industrial code

    Counsell, S., Hall, T., Shippey, T., Bowes, D., Tahir, A. & MacDonell, S., 14/11/2017, Proceedings - 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops, ISSREW 2017. Institute of Electrical and Electronics Engineers Inc., p. 20-23 4 p. 8109241

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  13. Published

    Getting defect prediction into industrial practice: The ELFF tool

    Bowes, D., Counsell, S., Hall, T., Petric, J. & Shippey, T., 14/11/2017, Proceedings - 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops, ISSREW 2017. Institute of Electrical and Electronics Engineers Inc., p. 44-47 4 p. 8109247

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

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