Home > Research > Engineering of Microwaves, Terahertz and Light (E-MIT) > Publications & Outputs

Research

View graph of relations

Engineering of Microwaves, Terahertz and Light (E-MIT)

101 - 110 out of 857Page size: 10
RSS feed of this list
  1. Published

    European Research on THz Vacuum Amplifiers

    Brunetti, F., Cojocarua, C. -S., de Rossi, A., Di Carlo, A., Dispenza, M., Dolfi, D., Durand, A., Fiorello, A., Gohier, A., Guiset, P., Korantia, M., Krozer, V., Legagneux, P., Marchesin, R., Megtert, S., Bouamrane, F., Mineo, M., Paoloni, C., Pham, K., Schnell, J. P., & 5 othersSecchi, A., Tamburri, E., Terranova, M. L., Ulisse, G. & Zhurbenko, V., 2010, 35TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ 2010). New York: IEEE, p. - 2 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  2. Published

    Realization of a carbon nanotube-based triode

    Brunetti, F., Lugli, P., Fiori, A., Orlanducci, S., Sessa, V., Tamburri, E., Toschi, F., Terranova, M. L., Riccitelli, R., Petrolati, E., von Neumann, L., Paoloni, C., Reale, A., di Carlo, A., Ciorba, A., Cirillo, M. & Merlo, V., 1/06/2006, Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on. IEEE, Vol. 1. p. 246-249 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

    Burbidge, M., Lechner, A., Bell, G. & Richardson, A. M. D., 2004, IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. p. 337-348 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  4. Published

    Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.

    Burbidge, M. J., Lechner, A. & Richardson, A. M. D., 2003, In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164 8 p.

    Research output: Contribution to Journal/Magazine › Journal article

  5. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Poullet, F., Tijou, J. & Richardson, A. M. D., 08/2003, In: Journal of Electronic Testing. 19, 4, p. 481-490 10 p.

    Research output: Contribution to Journal/Magazine › Journal article

  6. Published

    Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 2003, In: Journal of Electronic Testing.

    Research output: Contribution to Journal/Magazine › Journal article

  7. Published

    Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.

    Burbidge, M. J., Tijou, J. & Richardson, A. M. D., 19/12/2003, Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. Published

    Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.

    Burbidge, M. J., Tijou, J., Poullet, F. & Richardson, A. M. D., 2002, Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE, p. 95-102 8 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  9. Published

    Simple digital only test approach for embedded charge-pump phase-locked loops.

    Burbidge, M. & Richardson, A. M. D., 2001, In: Electronics Letters. 37, 22, p. 1318-1319 2 p.

    Research output: Contribution to Journal/Magazine › Journal article

  10. Published

    Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.

    Burbidge, M., Richardson, A. M. D. & Lechner, A., 2001, Proceedings of the 7th IEEE international test workshop. p. 97-102 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Previous 1...7 8 9 10 11 12 13 14 ...86 Next

Back to top