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Simple digital only test approach for embedded charge-pump phase-locked loops.

Research output: Contribution to Journal/MagazineJournal article

<mark>Journal publication date</mark>2001
<mark>Journal</mark>Electronics Letters
Issue number22
Number of pages2
Pages (from-to)1318-1319
Publication StatusPublished
<mark>Original language</mark>English


Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry

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