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Engineering of Microwaves, Terahertz and Light (E-MIT)

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  1. 1996
  2. Published

    Mixed signal test - Techniques, applications and demands

    Baker, K., Richardson, A. M. & Dorey, A. P., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  3. Published

    A practical approach based on a unilateral FET model for the design of a MMIC distributed amplifier

    Paoloni, C. & DAgostino, S., 11/1996, In: Microwave and Optical Technology Letters. 13, 4, p. 219-221 3 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)

    Richardson, A., Vermeiren, W., Straube, B. & Olbrich, T., 19/09/1996, p. 273. 8 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review

  5. Published

    Built-in self-test and diagnostic support for safety critical microsystems

    Olbrich, T., Richardson, A. M. D. & Bradley, D. A., 07/1996, In: Microelectronics Reliability. 36, 7-8, p. 1125-1136 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

    Olbrich, T., Bradley, D. A. & Richardson, A. M. D., 1/06/1996, In: Quality Engineering. 8, 4, p. 601-613 13 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    Action-centred learning in industry.

    Carter, R. G., Cooke, F. & Neal, R., 1996, Management of independent learning. Knight, P. & Tait, J. (eds.). Routledge, 164 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  8. Published

    Classical and quantum implications of the causality structure of two-dimensional space-times with degenerate metrics

    Gratus, J. & Tucker, R., 1996, In: Journal of Mathematical Physics. 37, 12, p. 6018-6032 14 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  9. Published

    Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.

    Olbrich, T., Perez, J., Grout, I., Richardson, A. & Ferrer, C., 1996, Proceedings of the international test conference 1996. Washington DC, p. 511-520 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

  10. Published

    Design and self-test for switched-current building blocks

    Olbrich, T. & Richardson, A., 1996, In: IEEE Design and Test of Computers. 13, 2, p. 10-17 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  11. Published

    Design-for-test strategies for analogue and mixed-signal integrated circuits

    Olbrich, T., Liberali, V., Maloberti, F. & Richardson, A., 1996, 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2. Caloba, L., Diniz, P., deQueiroz, A. & Watanabe, E. (eds.). NEW YORK: Eubios Ethics Institute, p. 1139-1144 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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