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Research

Dr Andrew Marshall

Senior Lecturer

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  1. 2006
  2. Published

    A comparison of the lower limit of multiplication noise in InP and InAlAs based APDs for telecommunications receiver applications.

    Marshall, A. R. J., Goh, Y. L., Tan, L. J. J., Tan, C. H., Ng, J. S. & David, J. P. R., 2006, 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2. New York: IEEE, p. 789-790 2 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Excess noise and avalanche multiplication in InAlAs

    Goh, Y. L., Massey, D. J., Marshall, A. R. J., Ng, J. S., Tan, C. H., Hopkinson, M. & David, J. P. R., 2006, 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2. New York: IEEE, p. 787-788 2 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  4. 2007
  5. Published

    Excess avalanche noise in In0.52Al0.48As

    Goh, Y. L., Marshall, A. R. J., Massey, D. J., Ng, J. S., Tan, C. H., Hopkinson, M., David, J. P. R., Jones, S. K., Button, C. C. & Pinches, S. M., 2007, In: IEEE Journal of Quantum Electronics. 43, 5-6, p. 503-507 5 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  6. Published

    Extremely low excess noise InAlAs avalanche photodiodes

    Tan, C. H., Goh, Y. L., Marshall, A. R. J., Tan, L. J. J., Ng, J. S. & David, J. P. R., 2007, 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings. New York: IEEE, p. 81-83 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Avalanche multiplication in InAlAs

    Goh, Y. L., Massey, D. J., Marshall, A. R. J., Ng, J. S., Tan, C. H., Ng, W. K., Rees, G. J., Hopkinson, A., David, J. P. R. & Jones, S. K., 01/2007, In: IEEE Transactions on Electron Devices. 54, 1, p. 11-16 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  8. Published

    Fabrication of InAs Photodiodes with reduced surface leakage current - art. no. 67400H

    Marshall, A. R. J., Tan, C. H., David, J. P. R., Ng, J. S. & Hopkinson, M., 10/2007, Optical Materials in Defence Systems Technology IV. Grote, J. G., Kajzar, F. & Lindgren, M. (eds.). Bellingham, Wash.: SPIE-INT SOC OPTICAL ENGINEERING

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  9. 2008
  10. Published

    Design considerations for In0.52Al0.48As based avalanche photodiodes

    Mun, S. C. L. T., Tan, C. H., Marshall, A. R. J., Goh, Y. L., Tan, L. J. J. & David, J. P. R., 2008, 20th International Conference on Indium Phosphide and Related Materials, 2008. IPRM 2008. . New York: IEEE, p. 331-333 3 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  11. Published

    Modeling of avalanche multiplication and excess noise factor in In0.52Al0.48As avalanche photodiodes using a simple Monte Carlo model

    Mun, S. C. L. T., Tan, C. H., Goh, Y. L., Marshall, A. R. J. & David, J. P. R., 1/07/2008, In: Journal of Applied Physics. 104, 1, p. - 6 p., 013114.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  12. Published

    Electron dominated impact ionization and avalanche gain characteristics in InAs photodiodes

    Marshall, A. R. J., Tan, C. H., Steer, M. J. & David, J. P. R., 15/09/2008, In: Applied Physics Letters. 93, 11, p. - 3 p., 111107.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  13. 2009
  14. Published

    Extremely Low Excess Noise in InAs Electron Avalanche Photodiodes

    Marshall, A. R. J., Tan, C. H., Steer, M. J. & David, J. P. R., 1/07/2009, In: IEEE Photonics Technology Letters. 21, 13, p. 866-868 3 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

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