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Research

Dr Jean Petric

Formerly at Lancaster University

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  1. Review article
  2. Published

    Reproducibility and replicability of software defect prediction studies

    Mahmood, Z., Bowes, D., Hall, T., Lane, P. C. R. & Petrić, J., 1/07/2018, In: Information and Software Technology. 99, p. 148-163 16 p.

    Research output: Contribution to Journal/Magazine › Review article › peer-review

  3. Journal article
  4. Published

    Software defect prediction: do different classifiers find the same defects?

    Bowes, D., Hall, T. & Petrić, J., 1/06/2018, In: Software Quality Journal. 26, 2, p. 525-552 28 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. Conference contribution/Paper
  6. Published

    BugVis: Commit slicing for fault visualisation

    Bowes, D., Petric, J. & Hall, T., 5/10/2020, ICPC '20: Proceedings of the 28th International Conference on Program Comprehension. New York: ACM, p. 436-440 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Zones of pain: Visualising the relationship between software architecture and defects

    Petrić, J., Hall, T. & Bowes, D., 31/08/2020, Quality of Information and Communications Technology: 13th International Conference, QUATIC 2020, Faro, Portugal, September 9–11, 2020, Proceedings. Shepperd, M., Brito e Abreu, F., Rodrigues da Silva, A. & Pérez-Castillo, R. (eds.). Cham: Springer Science and Business Media Deutschland GmbH, p. 135-143 9 p. (Communications in Computer and Information Science; vol. 1266).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Which Software Faults Are Tests Not Detecting?

    Petric, J., Hall, T. & Bowes, D., 15/04/2020, PROCEEDINGS of EASE 2020: Evaluation and Assessment in Software Engineering. New York: ACM, p. 160-169 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  9. Published

    How Effectively Is Defective Code Actually Tested? An Analysis of JUnit Tests in Seven Open Source Systems

    Petric, J., Hall, T. & Bowes, D., 10/10/2018, Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York, NY, USA: ACM, p. 42-51 10 p. (PROMISE'18).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  10. Published

    A Longitudinal Study of Anti Micro Patterns in 113 Versions of Tomcat

    Destefanis, G., Qaderi, S., Bowes, D., Petric, J. & Ortu, M., 10/10/2018, PROMISE'18 Proceedings of the 14th International Conference on Predictive Models and Data Analytics in Software Engineering. New York, NY, USA: ACM, p. 90-93 4 p. (PROMISE'18).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  11. Published

    Getting defect prediction into industrial practice: The ELFF tool

    Bowes, D., Counsell, S., Hall, T., Petric, J. & Shippey, T., 14/11/2017, Proceedings - 2017 IEEE 28th International Symposium on Software Reliability Engineering Workshops, ISSREW 2017. Institute of Electrical and Electronics Engineers Inc., p. 44-47 4 p. 8109247

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  12. Published

    How Good Are My Tests?

    Bowes, D., Hall, T., Petrić, J., Shippey, T. & Turhan, B., 3/07/2017, 2017 IEEE/ACM 8th Workshop on Emerging Trends in Software Metrics (WETSoM). IEEE Computer Society, p. 9-14 6 p. 7968009. (2017 IEEE/ACM 8th Workshop on Emerging Trends in Software Metrics (WETSoM)).

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  13. Published

    Building an Ensemble for Software Defect Prediction Based on Diversity Selection

    Petrić, J., Bowes, D., Hall, T., Christianson, B. & Baddoo, N., 8/09/2016, ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement. New York: Association for Computing Machinery, Inc, 10 p. 46

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  14. Published

    The Jinx on the NASA software defect data sets

    Petrić, J., Bowes, D., Hall, T., Christianson, B. & Baddoo, N., 1/06/2016, EASE '16 Proceedings of the 20th International Conference on Evaluation and Assessment in Software Engineering. New York: Association for Computing Machinery, Inc, 5 p. 13

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  15. Published

    Using different characteristics of machine learners to identify different defect families

    Petric, J., 1/06/2016, EASE '16 Proceedings of the 20th International Conference on Evaluation and Assessment in Software Engineering. New York: ACM, 4 p. 5

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  16. Published

    Different classifiers find different defects although with different level of consistency

    Bowes, D., Hall, T. & Petrić, J., 21/10/2015, PROMISE '15 Proceedings of the 11th International Conference on Predictive Models and Data Analytics in Software Engineering. New York: Association for Computing Machinery, Inc, 10 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  17. Published

    Software structure evolution and relation to system defectiveness

    Petric, J. & Grbac, T. G., 2014, EASE '14 Proceedings of the 18th International Conference on Evaluation and Assessment in Software Engineering. New York: ACM, 34

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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