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Professor Oleg Kolosov SFHEA

Professor of Nanoscience

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  1. 2000
  2. Published

    Mapping surface elastic properties of stiff and compliant materials on the nanoscale using ultrasonic force microscopy

    Dinelli, F., Castell, M. R., Ritchie, D. A., Mason, N. J., Briggs, G. A. D. & Kolosov, O., 10/2000, In: Philosophical Magazine A. 80, 10, p. 2299-2323 25 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  3. Published

    Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies

    Cuberes, M. T., Assender, H. E., Briggs, G. A. D. & Kolosov, O., 7/10/2000, In: Journal of Physics D: Applied Physics. 33, 19, p. 2347-2355 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Nucleation and growth of gas barrier aluminium oxide on surfaces of poly(ethylene terephthalate) and polypropylene: Effects of the polymer surface properties

    Deng, C. S., Assender, H. E., Dinelli, F., Kolosov, O., Briggs, G. A. D., Miyamoto, T. & Tsukahara, Y., 1/12/2000, In: Journal of Polymer Science Part B: Polymer Physics. 38, 23, p. 3151-3162 12 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. 2001
  6. Published

    Characterisation of the nanometer-scale mechanical compliance of semiconductors by Ultrasonic Force Microscopy

    Huey, B. D., Langford, R. M., Briggs, G. A. D. & Kolosov, O., 2001, Microscopy of Semiconducting Materials 2001. Cullis, A. G. & Hutchison, J. L. (eds.). Bristol: IOP Publishing Ltd, p. 531-534 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  7. Published

    Nanoscale elastic imaging and mechanical modulus measurements of aluminum/low-k dielectric interconnect structures

    Shekhawat, G. S., Briggs, G. A. D., Kolosov, O. & Geer, R. E., 2001, Characterization and metrology for ULSI Technology 2000, International Conference. Seiler, D. G., Diebold, A. C., Shaffner, T. J., McDonald, R., Bullis, W. M., Smith, P. J. & Secula, E. M. (eds.). Melville, New York: American Institute of Physics, p. 449-452 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  8. Published

    Nonlinear detection of ultrasonic vibration of AFM cantilevers in and out of contact with the sample.

    Kolosov, O., Briggs, G. A. D. & Cuberes, M. T., 03/2001, In: Nanotechnology. 12, 1, p. 53-59 7 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  9. Published

    Instrument for high throughput measurement of material physical properties and method of using same

    Freitag, C., Kolosov, O., Hajduk, D. & Carlson, E., 18/04/2001, IPC No. GO1N 3/00;, Patent No. CA2344755A1

    Research output: Patent

  10. Published

    High throughput synthesis and screening in specialty polymers applications.

    Charmot, D., Mansky, P., Kolosov, O., Benoit, D., Klaerner, G., Petro, M., Jayaraman, M., Piotti, M., Chang, H. T. & Nava-Salgado, V., 08/2001, In: Abstracts of Papers of the American Chemical Society. 222, p. U307-U307 1 p.

    Research output: Contribution to Journal/Magazine › Meeting abstract › peer-review

  11. Published

    AFM and UFM surface characterization of rubber-toughened poly(methyl methacrylate) samples

    Porfyrakis, K., Kolosov, O. & Assender, H. E., 9/12/2001, In: Journal of Applied Polymer Science. 82, 11, p. 2790-2798 9 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  12. 2002
  13. Published

    Instrument for high throughput measurement of material physical properties

    Hajduk, D., Carlson, E., Freitag, C. & Kolosov, O., 23/01/2002, IPC No. GO1D 1/16; GO1D 7/02; GO1N 3/00; GO1N 3/24; GO1M 7/00, Patent No. JP2002-22630A

    Research output: Patent

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