Minimally invasive neutron beam monitoring for single-event effects accelerated testing

Zhang, L. H. & Platt, S. P., 1/12/2011, RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. p. 945-949 5 p. 6131336. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper

Fidelity of energy spectra at neutron facilities for single-event effects testing

Platt, S. P., Prokofiev, A. V. & Xiao, C. X., 20/10/2010, 2010 IEEE International Reliability Physics Symposium, IRPS 2010. IEEE, p. 411-416 6 p. 5488795. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Characterization of the ANITA neutron source for accelerated SEE testing at the Svedberg Laboratory

Prokofiev, A. V., Blomgren, J., Majerle, M., Nolte, R., Röttger, S., Platt, S. P., Xiao, C. X. & Smirnov, A. N., 1/12/2009, 2009 IEEE Radiation Effects Data Workshop, REDW 2009 - Workshop Record, Held in Conjunction with the IEEE Nuclear and Space Radiation Effects Conference, NSREC 2009. IEEE, p. 166-173 8 p. 5336295. (IEEE Radiation Effects Data Workshop).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

ANITA - A new neutron facility for accelerated SEE testing at the Svedberg Laboratory

Prokofiev, A. V., Blomgren, J., Platt, S. P., Nolte, R., Röttger, S. & Smirnov, A. N., 17/11/2009, 2009 IEEE International Reliability Physics Symposium, IRPS 2009. IEEE, p. 929-935 7 p. 5173383. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Characterization of the ANITA neutron source for accelerated SEE testing at the Svedberg laboratory

Prokofiev, A. V., Blomgren, J., Nolte, R., Platt, S. P., Röttger, S. & Smirnov, A. N., 1/12/2008, 2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008. IEEE, p. 260-267 8 p. 5782723. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper

Factors impacting the temperature dependence of soft errors in commercial SRAMs

Bagatin, M., Gerardin, S., Paccagnella, A., Andreani, C., Gorini, G., Pietropaolo, A., Platt, S. P. & Frost, C. D., 1/12/2008, 2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008. IEEE, p. 100-106 7 p. 5782693. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper

Neutron-induced soft errors in advanced flash memories

Cellere, G., Gerardin, S., Bagatin, M., Paccagnella, A., Visconti, A., Bonanomi, M., Beltrami, S., Roche, P., Gasiot, G., Sørensen, R. H., Virtanen, A., Frost, C., Fuochi, P., Andreani, C., Gorini, G., Pietropaolo, A. & Platt, S., 1/12/2008, 2008 IEEE International Electron Devices Meeting, IEDM 2008. IEEE, 4 p. 4796693. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper