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    Accepted author manuscript, 376 KB, PDF document

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A failure mode analysis of a 6-bit folding ADCs.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

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A failure mode analysis of a 6-bit folding ADCs. / Lechner, A.; Richardson, Andrew M. D.; Burbidge, M. et al.
Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). 2001. p. 19-23.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Lechner, A, Richardson, AMD, Burbidge, M & Hermes, B 2001, A failure mode analysis of a 6-bit folding ADCs. in Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). pp. 19-23. <http://users.ece.gatech.edu/chat/IMSTW/>

APA

Lechner, A., Richardson, A. M. D., Burbidge, M., & Hermes, B. (2001). A failure mode analysis of a 6-bit folding ADCs. In Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01) (pp. 19-23) http://users.ece.gatech.edu/chat/IMSTW/

Vancouver

Lechner A, Richardson AMD, Burbidge M, Hermes B. A failure mode analysis of a 6-bit folding ADCs. In Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). 2001. p. 19-23

Author

Lechner, A. ; Richardson, Andrew M. D. ; Burbidge, M. et al. / A failure mode analysis of a 6-bit folding ADCs. Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). 2001. pp. 19-23

Bibtex

@inbook{82be51bb1e6d4369bbdad553c1c474e1,
title = "A failure mode analysis of a 6-bit folding ADCs.",
author = "A. Lechner and Richardson, {Andrew M. D.} and M. Burbidge and B. Hermes",
year = "2001",
language = "English",
pages = "19--23",
booktitle = "Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW {\textquoteright}01)",

}

RIS

TY - CHAP

T1 - A failure mode analysis of a 6-bit folding ADCs.

AU - Lechner, A.

AU - Richardson, Andrew M. D.

AU - Burbidge, M.

AU - Hermes, B.

PY - 2001

Y1 - 2001

M3 - Chapter

SP - 19

EP - 23

BT - Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01)

ER -