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A high speed, multi-frequency impedance analysing node.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Published

Standard

A high speed, multi-frequency impedance analysing node. / Dickinson, S. J.; Peyton, A. J.
Proceedings of the 2nd world congress on industrial process tomography. 2001. p. 502-510.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Harvard

Dickinson, SJ & Peyton, AJ 2001, A high speed, multi-frequency impedance analysing node. in Proceedings of the 2nd world congress on industrial process tomography. pp. 502-510.

APA

Dickinson, S. J., & Peyton, A. J. (2001). A high speed, multi-frequency impedance analysing node. In Proceedings of the 2nd world congress on industrial process tomography (pp. 502-510)

Vancouver

Dickinson SJ, Peyton AJ. A high speed, multi-frequency impedance analysing node. In Proceedings of the 2nd world congress on industrial process tomography. 2001. p. 502-510

Author

Dickinson, S. J. ; Peyton, A. J. / A high speed, multi-frequency impedance analysing node. Proceedings of the 2nd world congress on industrial process tomography. 2001. pp. 502-510

Bibtex

@inbook{2c738fd9d6b242f0bb3d690e30ac7be5,
title = "A high speed, multi-frequency impedance analysing node.",
author = "Dickinson, {S. J.} and Peyton, {A. J.}",
year = "2001",
language = "English",
pages = "502--510",
booktitle = "Proceedings of the 2nd world congress on industrial process tomography",

}

RIS

TY - CHAP

T1 - A high speed, multi-frequency impedance analysing node.

AU - Dickinson, S. J.

AU - Peyton, A. J.

PY - 2001

Y1 - 2001

M3 - Chapter

SP - 502

EP - 510

BT - Proceedings of the 2nd world congress on industrial process tomography

ER -