A multi-frequency impedance analyser for electrical tomography systems.

School of Engineering

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Standard

A multi-frequency impedance analyser for electrical tomography systems. / Yin, W.; Dickinson, S. J.; Peyton, A. J.
Proceedings of the 4th world congress on industrial process tomography. 2005. p. 30-35.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Yin, W, Dickinson, SJ & Peyton, AJ 2005, A multi-frequency impedance analyser for electrical tomography systems. in Proceedings of the 4th world congress on industrial process tomography. pp. 30-35.

APA

Yin, W., Dickinson, S. J., & Peyton, A. J. (2005). A multi-frequency impedance analyser for electrical tomography systems. In Proceedings of the 4th world congress on industrial process tomography (pp. 30-35)

Vancouver

Yin W, Dickinson SJ, Peyton AJ. A multi-frequency impedance analyser for electrical tomography systems. In Proceedings of the 4th world congress on industrial process tomography. 2005. p. 30-35

Author

Yin, W. ; Dickinson, S. J. ; Peyton, A. J. / A multi-frequency impedance analyser for electrical tomography systems. Proceedings of the 4th world congress on industrial process tomography. 2005. pp. 30-35

Bibtex

@inbook{aeb69b81534c44428d372f9265c03956,

title = "A multi-frequency impedance analyser for electrical tomography systems.",

author = "W. Yin and Dickinson, {S. J.} and Peyton, {A. J.}",

year = "2005",

language = "English",

pages = "30--35",

booktitle = "Proceedings of the 4th world congress on industrial process tomography",

}

RIS

TY - CHAP

T1 - A multi-frequency impedance analyser for electrical tomography systems.

AU - Yin, W.

AU - Dickinson, S. J.

AU - Peyton, A. J.

PY - 2005

Y1 - 2005

M3 - Chapter

SP - 30

EP - 35

BT - Proceedings of the 4th world congress on industrial process tomography

ER -

Research