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Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
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TY - GEN
T1 - A Sequential Monte Carlo Approach for Extended Object Tracking in the Presence of Clutter
AU - Petrov, Nikolay
AU - Mihaylova, Lyudmila
AU - Gning, Amadou
AU - Angelova, Donka
PY - 2011/10/1
Y1 - 2011/10/1
N2 - Extended objects are characterised with multiple measurements originated from ifferent locations of the object surface. This paper presents a novel Sequential Monte Carlo (SMC) approach for extended object tracking in the presence of clutter. The problem is formulated for general nonlinear problems. The main contribution of this work is in the derivation of the likelihood function for nonlinear measurement functions, with sets of measurements belonging to a bounded region. Simulation results are presented when the object is surrounded by a circular region. Accurate estimation results are presented both for the object kinematic state and object extent.
AB - Extended objects are characterised with multiple measurements originated from ifferent locations of the object surface. This paper presents a novel Sequential Monte Carlo (SMC) approach for extended object tracking in the presence of clutter. The problem is formulated for general nonlinear problems. The main contribution of this work is in the derivation of the likelihood function for nonlinear measurement functions, with sets of measurements belonging to a bounded region. Simulation results are presented when the object is surrounded by a circular region. Accurate estimation results are presented both for the object kinematic state and object extent.
KW - sequential Monte Carlo methods
KW - tracking
KW - clutter
KW - extended objects
KW - state and parameter estimation
M3 - Conference contribution/Paper
SN - 978-3-88579-286-4
T3 - Lecture Notes in Informatics
SP - 1
EP - 11
BT - Lecture Notes from Informatics
CY - Berlin, Germany
T2 - INFORMATIK 2011
Y2 - 4 October 2011 through 10 October 2011
ER -