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Research output: Contribution to Journal/Magazine › Journal article › peer-review
Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Accurate Modelling of Monotron Oscillations in Small and Large Signal regimes
AU - Cai, Jinchi
AU - Syratchev, Igor
AU - Burt, Graeme
PY - 2020/2/20
Y1 - 2020/2/20
N2 - In Klystron amplifiers, monotron oscillations may cause unacceptable beam instabilities. To facilitate fast and accurate analysis of such processes, rather than performing timeconsuming Particle-in-Cell simulations, the theory of themonotron oscillations has been further developed for the small and large signal regimes and implemented into the klystron computer code KlyC. This development includes full considerations of the space charge effects, relativistic effects and can operate with arbitrary field distributions of the resonant mode. The effectiveness of these methods, have been demonstrated through benchmarking against PIC codes and has shown good (at 1% level) agreement, whilst KlyC computation time is significantly (at least 100 times) faster than in the PIC simulations.
AB - In Klystron amplifiers, monotron oscillations may cause unacceptable beam instabilities. To facilitate fast and accurate analysis of such processes, rather than performing timeconsuming Particle-in-Cell simulations, the theory of themonotron oscillations has been further developed for the small and large signal regimes and implemented into the klystron computer code KlyC. This development includes full considerations of the space charge effects, relativistic effects and can operate with arbitrary field distributions of the resonant mode. The effectiveness of these methods, have been demonstrated through benchmarking against PIC codes and has shown good (at 1% level) agreement, whilst KlyC computation time is significantly (at least 100 times) faster than in the PIC simulations.
U2 - 10.1109/TED.2020.2971279
DO - 10.1109/TED.2020.2971279
M3 - Journal article
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
SN - 0018-9383
ER -