Standard
Analysis of measurement uncertainty in THz-TDS. / Withayachumnankul, W.
; Lin, Hungyen; Mickan, S. P. et al.
Proceedings of SPIE : Photonics Materials, Devices, and Applications II. ed. / Ali Serpengüzel; Gonçal Badenes; Giancarlo Righini. Vol. 6593 SPIE, 2007. 659326L (Proceedings of SPIE; Vol. 6593).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Withayachumnankul, W
, Lin, H, Mickan, SP, Fischer, BM & Abbott, D 2007,
Analysis of measurement uncertainty in THz-TDS. in A Serpengüzel, G Badenes & G Righini (eds),
Proceedings of SPIE : Photonics Materials, Devices, and Applications II. vol. 6593, 659326L, Proceedings of SPIE, vol. 6593, SPIE.
https://doi.org/10.1117/12.721876APA
Withayachumnankul, W.
, Lin, H., Mickan, S. P., Fischer, B. M., & Abbott, D. (2007).
Analysis of measurement uncertainty in THz-TDS. In A. Serpengüzel, G. Badenes, & G. Righini (Eds.),
Proceedings of SPIE : Photonics Materials, Devices, and Applications II (Vol. 6593). Article 659326L (Proceedings of SPIE; Vol. 6593). SPIE.
https://doi.org/10.1117/12.721876Vancouver
Withayachumnankul W
, Lin H, Mickan SP, Fischer BM, Abbott D.
Analysis of measurement uncertainty in THz-TDS. In Serpengüzel A, Badenes G, Righini G, editors, Proceedings of SPIE : Photonics Materials, Devices, and Applications II. Vol. 6593. SPIE. 2007. 659326L. (Proceedings of SPIE). doi: 10.1117/12.721876
Author
Bibtex
@inproceedings{aeaac58b1b34465cbdac37822939526d,
title = "Analysis of measurement uncertainty in THz-TDS",
abstract = "Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process. ",
author = "W. Withayachumnankul and Hungyen Lin and Mickan, {S. P.} and Fischer, {Bernd M.} and Derek Abbott",
year = "2007",
doi = "10.1117/12.721876",
language = "English",
volume = "6593",
series = "Proceedings of SPIE",
publisher = "SPIE",
editor = "Ali Serpeng{\"u}zel and Gon{\c c}al Badenes and Giancarlo Righini",
booktitle = "Proceedings of SPIE",
}
RIS
TY - GEN
T1 - Analysis of measurement uncertainty in THz-TDS
AU - Withayachumnankul, W.
AU - Lin, Hungyen
AU - Mickan, S. P.
AU - Fischer, Bernd M.
AU - Abbott, Derek
PY - 2007
Y1 - 2007
N2 - Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.
AB - Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.
U2 - 10.1117/12.721876
DO - 10.1117/12.721876
M3 - Conference contribution/Paper
VL - 6593
T3 - Proceedings of SPIE
BT - Proceedings of SPIE
A2 - Serpengüzel, Ali
A2 - Badenes, Gonçal
A2 - Righini, Giancarlo
PB - SPIE
ER -
