Rights statement: © ACM, 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement http://dx.doi.org/10.1145/2961111.2962610
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Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
}
TY - GEN
T1 - Building an Ensemble for Software Defect Prediction Based on Diversity Selection
AU - Petrić, Jean
AU - Bowes, David
AU - Hall, Tracy
AU - Christianson, Bruce
AU - Baddoo, Nathan
N1 - © ACM, 2016. This is the author's version of the work. It is posted here for your personal use. Not for redistribution. The definitive Version of Record was published in ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement http://dx.doi.org/10.1145/2961111.2962610
PY - 2016/9/8
Y1 - 2016/9/8
N2 - Background: Ensemble techniques have gained attention in various scientific fields. Defect prediction researchers have investigated many state-of-the-art ensemble models and concluded that in many cases these outperform standard single classifier techniques. Almost all previous work using ensemble techniques in defect prediction rely on the majority voting scheme for combining prediction outputs, and on the implicit diversity among single classifiers. Aim: Investigate whether defect prediction can be improved using an explicit diversity technique with stacking ensemble, given the fact that different classifiers identify different sets of defects. Method: We used classifiers from four different families and the weighted accuracy diversity (WAD) technique to exploit diversity amongst classifiers. To combine individual predictions, we used the stacking ensemble technique. We used state-of-the-art knowledge in software defect prediction to build our ensemble models, and tested their prediction abilities against 8 publicly available data sets. Conclusion: The results show performance improvement using stacking ensembles compared to other defect prediction models. Diversity amongst classifiers used for building ensembles is essential to achieving these performance improvements.
AB - Background: Ensemble techniques have gained attention in various scientific fields. Defect prediction researchers have investigated many state-of-the-art ensemble models and concluded that in many cases these outperform standard single classifier techniques. Almost all previous work using ensemble techniques in defect prediction rely on the majority voting scheme for combining prediction outputs, and on the implicit diversity among single classifiers. Aim: Investigate whether defect prediction can be improved using an explicit diversity technique with stacking ensemble, given the fact that different classifiers identify different sets of defects. Method: We used classifiers from four different families and the weighted accuracy diversity (WAD) technique to exploit diversity amongst classifiers. To combine individual predictions, we used the stacking ensemble technique. We used state-of-the-art knowledge in software defect prediction to build our ensemble models, and tested their prediction abilities against 8 publicly available data sets. Conclusion: The results show performance improvement using stacking ensembles compared to other defect prediction models. Diversity amongst classifiers used for building ensembles is essential to achieving these performance improvements.
KW - diversity
KW - ensembles of learning machines
KW - Software defect prediction
KW - software faults
KW - stacking
U2 - 10.1145/2961111.2962610
DO - 10.1145/2961111.2962610
M3 - Conference contribution/Paper
AN - SCOPUS:84991666877
BT - ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement
PB - Association for Computing Machinery, Inc
CY - New York
T2 - 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2016
Y2 - 8 September 2016 through 9 September 2016
ER -