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Charge-collection and single-event upset measurements at the ISIS neutron source

Research output: Other contribution

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Charge-collection and single-event upset measurements at the ISIS neutron source. / Platt, S. P.; Torok, Z.; Frost, C. D. et al.
6 p. IEEE. 2007, Conference paper.

Research output: Other contribution

Harvard

Platt, SP, Torok, Z, Frost, CD & Ansell, S 2007, Charge-collection and single-event upset measurements at the ISIS neutron source. IEEE. https://doi.org/10.1109/RADECS.2007.5205540

APA

Platt, S. P., Torok, Z., Frost, C. D., & Ansell, S. (2007). Charge-collection and single-event upset measurements at the ISIS neutron source. IEEE. https://doi.org/10.1109/RADECS.2007.5205540

Vancouver

Platt SP, Torok Z, Frost CD, Ansell S. Charge-collection and single-event upset measurements at the ISIS neutron source. 2007. 6 p. doi: 10.1109/RADECS.2007.5205540

Author

Platt, S. P. ; Torok, Z. ; Frost, C. D. et al. / Charge-collection and single-event upset measurements at the ISIS neutron source. 2007. IEEE. 6 p.

Bibtex

@misc{90a921eb39cd47c4921aa79e8e820362,
title = "Charge-collection and single-event upset measurements at the ISIS neutron source",
abstract = "Accelerated testing for neutron-induced SEE using spallation neutron sources is a well-established technique [1]. The best-known facility for this purpose is that at the Los Alamos Neutron Science Center (LANSCE) ICE House [2]. The VESUVIO instrument at the ISIS neutron source [3] is also available for such measurements, and results from this facility have begun to be published [4]. In this paper, we present the results of charge collection and SEU cross-section measurements made at ISIS, with comparison to equivalent results obtained at LANSCE. In so doing we characterise the VESUVIO beam for the purpose of SEE testing, using LANSCE as a benchmark. Charge collection statistics are used to determine LANSCE-equivalent flux [5] and the SEU behaviour of a static RAM-based FPGA is compared with previously published data from LANSCE [6]–[7][8].",
author = "Platt, {S. P.} and Z. Torok and Frost, {C. D.} and S. Ansell",
year = "2007",
doi = "10.1109/RADECS.2007.5205540",
language = "English",
isbn = "9781424417049",
publisher = "IEEE",
type = "Other",

}

RIS

TY - GEN

T1 - Charge-collection and single-event upset measurements at the ISIS neutron source

AU - Platt, S. P.

AU - Torok, Z.

AU - Frost, C. D.

AU - Ansell, S.

PY - 2007

Y1 - 2007

N2 - Accelerated testing for neutron-induced SEE using spallation neutron sources is a well-established technique [1]. The best-known facility for this purpose is that at the Los Alamos Neutron Science Center (LANSCE) ICE House [2]. The VESUVIO instrument at the ISIS neutron source [3] is also available for such measurements, and results from this facility have begun to be published [4]. In this paper, we present the results of charge collection and SEU cross-section measurements made at ISIS, with comparison to equivalent results obtained at LANSCE. In so doing we characterise the VESUVIO beam for the purpose of SEE testing, using LANSCE as a benchmark. Charge collection statistics are used to determine LANSCE-equivalent flux [5] and the SEU behaviour of a static RAM-based FPGA is compared with previously published data from LANSCE [6]–[7][8].

AB - Accelerated testing for neutron-induced SEE using spallation neutron sources is a well-established technique [1]. The best-known facility for this purpose is that at the Los Alamos Neutron Science Center (LANSCE) ICE House [2]. The VESUVIO instrument at the ISIS neutron source [3] is also available for such measurements, and results from this facility have begun to be published [4]. In this paper, we present the results of charge collection and SEU cross-section measurements made at ISIS, with comparison to equivalent results obtained at LANSCE. In so doing we characterise the VESUVIO beam for the purpose of SEE testing, using LANSCE as a benchmark. Charge collection statistics are used to determine LANSCE-equivalent flux [5] and the SEU behaviour of a static RAM-based FPGA is compared with previously published data from LANSCE [6]–[7][8].

U2 - 10.1109/RADECS.2007.5205540

DO - 10.1109/RADECS.2007.5205540

M3 - Other contribution

SN - 9781424417049

PB - IEEE

ER -