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Complex Patterns of Failure: Fault Tolerance via Complex Event Processing for IoT Systems. /
Power, Alexander; Kotonya, Gerald.
Proceedings - 2019 IEEE International Congress on Cybermatics: 12th IEEE International Conference on Internet of Things, 15th IEEE International Conference on Green Computing and Communications, 12th IEEE International Conference on Cyber, Physical and Social Computing and 5th IEEE International Conference on Smart Data, iThings/GreenCom/CPSCom/SmartData 2019. IEEE, 2019. p. 986-993 8875363.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
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Power, A & Kotonya, G 2019,
Complex Patterns of Failure: Fault Tolerance via Complex Event Processing for IoT Systems. in
Proceedings - 2019 IEEE International Congress on Cybermatics: 12th IEEE International Conference on Internet of Things, 15th IEEE International Conference on Green Computing and Communications, 12th IEEE International Conference on Cyber, Physical and Social Computing and 5th IEEE International Conference on Smart Data, iThings/GreenCom/CPSCom/SmartData 2019., 8875363, IEEE, pp. 986-993, 2019 IEEE International Conference on Internet of Things (iThings-2019), Atlanta, Georgia, United States,
14/07/19.
https://doi.org/10.1109/iThings/GreenCom/CPSCom/SmartData.2019.00173
APA
Vancouver
Power A, Kotonya G.
Complex Patterns of Failure: Fault Tolerance via Complex Event Processing for IoT Systems. In Proceedings - 2019 IEEE International Congress on Cybermatics: 12th IEEE International Conference on Internet of Things, 15th IEEE International Conference on Green Computing and Communications, 12th IEEE International Conference on Cyber, Physical and Social Computing and 5th IEEE International Conference on Smart Data, iThings/GreenCom/CPSCom/SmartData 2019. IEEE. 2019. p. 986-993. 8875363 Epub 2019 Jul 14. doi: 10.1109/iThings/GreenCom/CPSCom/SmartData.2019.00173
Author
Bibtex
@inproceedings{8194b1f81a4244449fe26fbe8008a6ed,
title = "Complex Patterns of Failure: Fault Tolerance via Complex Event Processing for IoT Systems",
abstract = "Fault-tolerance (FT) support is a key challenge for ensuring dependable Internet of Things (IoT) systems. Many existing FT-support mechanisms for IoT are static, tightly coupled, and inflexible, and so they struggle to provide effective support for dynamic IoT environments. This paper proposes Complex Patterns of Failure (CPoF), an approach to providing FT support for IoT systems using Complex Event Processing (CEP) that promotes modularity and reusability in FT-support design. System defects are defined using our Vulnerabilities, Faults, and Failures (VFF) framework, and error-detection strategies are defined as nondeterministic finite automata (NFA) implemented via CEP systems. We evaluated CPoF on an automated agriculture system and demonstrated its effectiveness against three types of error-detection checks: reasonableness, timing, and reversal. Using CPoF, we identified unreasonable environmental conditions and performance degradation via sensor data analysis.",
keywords = "internet of things, fault tolerance, dependability, complex event processing, automata",
author = "Alexander Power and Gerald Kotonya",
year = "2019",
month = oct,
day = "21",
doi = "10.1109/iThings/GreenCom/CPSCom/SmartData.2019.00173",
language = "English",
pages = "986--993",
booktitle = "Proceedings - 2019 IEEE International Congress on Cybermatics",
publisher = "IEEE",
note = "2019 IEEE International Conference on Internet of Things (iThings-2019), iThings 2019 ; Conference date: 14-07-2019 Through 17-07-2019",
url = "http://cse.stfx.ca/~cybermatics/2019/ithings/index.php",
}
RIS
TY - GEN
T1 - Complex Patterns of Failure
T2 - 2019 IEEE International Conference on Internet of Things (iThings-2019)
AU - Power, Alexander
AU - Kotonya, Gerald
PY - 2019/10/21
Y1 - 2019/10/21
N2 - Fault-tolerance (FT) support is a key challenge for ensuring dependable Internet of Things (IoT) systems. Many existing FT-support mechanisms for IoT are static, tightly coupled, and inflexible, and so they struggle to provide effective support for dynamic IoT environments. This paper proposes Complex Patterns of Failure (CPoF), an approach to providing FT support for IoT systems using Complex Event Processing (CEP) that promotes modularity and reusability in FT-support design. System defects are defined using our Vulnerabilities, Faults, and Failures (VFF) framework, and error-detection strategies are defined as nondeterministic finite automata (NFA) implemented via CEP systems. We evaluated CPoF on an automated agriculture system and demonstrated its effectiveness against three types of error-detection checks: reasonableness, timing, and reversal. Using CPoF, we identified unreasonable environmental conditions and performance degradation via sensor data analysis.
AB - Fault-tolerance (FT) support is a key challenge for ensuring dependable Internet of Things (IoT) systems. Many existing FT-support mechanisms for IoT are static, tightly coupled, and inflexible, and so they struggle to provide effective support for dynamic IoT environments. This paper proposes Complex Patterns of Failure (CPoF), an approach to providing FT support for IoT systems using Complex Event Processing (CEP) that promotes modularity and reusability in FT-support design. System defects are defined using our Vulnerabilities, Faults, and Failures (VFF) framework, and error-detection strategies are defined as nondeterministic finite automata (NFA) implemented via CEP systems. We evaluated CPoF on an automated agriculture system and demonstrated its effectiveness against three types of error-detection checks: reasonableness, timing, and reversal. Using CPoF, we identified unreasonable environmental conditions and performance degradation via sensor data analysis.
KW - internet of things
KW - fault tolerance
KW - dependability
KW - complex event processing
KW - automata
U2 - 10.1109/iThings/GreenCom/CPSCom/SmartData.2019.00173
DO - 10.1109/iThings/GreenCom/CPSCom/SmartData.2019.00173
M3 - Conference contribution/Paper
SP - 986
EP - 993
BT - Proceedings - 2019 IEEE International Congress on Cybermatics
PB - IEEE
Y2 - 14 July 2019 through 17 July 2019
ER -
