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Comprehensive modeling of THz microscope with a sub-wavelength source

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Comprehensive modeling of THz microscope with a sub-wavelength source. / Lin, Hungyen; Fumeaux, Christophe; Ung, B. S. Y. et al.
In: Optics Express, Vol. 19, No. 6, 2011, p. 5327-5338.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Lin, H, Fumeaux, C, Ung, BSY & Abbott, D 2011, 'Comprehensive modeling of THz microscope with a sub-wavelength source', Optics Express, vol. 19, no. 6, pp. 5327-5338. https://doi.org/10.1364/OE.19.005327

APA

Lin, H., Fumeaux, C., Ung, B. S. Y., & Abbott, D. (2011). Comprehensive modeling of THz microscope with a sub-wavelength source. Optics Express, 19(6), 5327-5338. https://doi.org/10.1364/OE.19.005327

Vancouver

Lin H, Fumeaux C, Ung BSY, Abbott D. Comprehensive modeling of THz microscope with a sub-wavelength source. Optics Express. 2011;19(6):5327-5338. doi: 10.1364/OE.19.005327

Author

Lin, Hungyen ; Fumeaux, Christophe ; Ung, B. S. Y. et al. / Comprehensive modeling of THz microscope with a sub-wavelength source. In: Optics Express. 2011 ; Vol. 19, No. 6. pp. 5327-5338.

Bibtex

@article{8c1eb0d8c10848a89b9830574899ee6c,
title = "Comprehensive modeling of THz microscope with a sub-wavelength source",
abstract = "The sub-wavelength THz emission point on a nonlinear electro-optical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.",
author = "Hungyen Lin and Christophe Fumeaux and Ung, {B. S. Y.} and Derek Abbott",
year = "2011",
doi = "10.1364/OE.19.005327",
language = "English",
volume = "19",
pages = "5327--5338",
journal = "Optics Express",
issn = "1094-4087",
publisher = "Optical Society of American (OSA)",
number = "6",

}

RIS

TY - JOUR

T1 - Comprehensive modeling of THz microscope with a sub-wavelength source

AU - Lin, Hungyen

AU - Fumeaux, Christophe

AU - Ung, B. S. Y.

AU - Abbott, Derek

PY - 2011

Y1 - 2011

N2 - The sub-wavelength THz emission point on a nonlinear electro-optical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.

AB - The sub-wavelength THz emission point on a nonlinear electro-optical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.

U2 - 10.1364/OE.19.005327

DO - 10.1364/OE.19.005327

M3 - Journal article

VL - 19

SP - 5327

EP - 5338

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 6

ER -