Research output: Contribution to Journal/Magazine › Journal article › peer-review
Controlling thin liquid film viscosity via modification of substrate surface chemistry. / Bowen, James; Cheneler, David; Adams, Mike.
In: Colloids and Surfaces A: Physicochemical and Engineering Aspects, Vol. 418, 05.02.2013, p. 112-116.Research output: Contribution to Journal/Magazine › Journal article › peer-review
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TY - JOUR
T1 - Controlling thin liquid film viscosity via modification of substrate surface chemistry
AU - Bowen, James
AU - Cheneler, David
AU - Adams, Mike
PY - 2013/2/5
Y1 - 2013/2/5
N2 - The viscosity of thin films of liquid poly(dimethylsiloxane) have been studied on silicon and fluoropolymer-coated silicon by means of a perturbation technique applied using colloid probe atomic force microscopy. The liquid film supported by a silicon substrate exhibited a greater viscosity than the bulk liquid, due to the strong interaction between the molecules near to the liquid/solid interface. In comparison, the liquid film supported by a fluoropolymer-coated substrate exhibited a similar viscosity to the bulk liquid, due to the weak interaction between the liquid and the fluoropolymer surface. This demonstrates the possibility to control the viscosity of thin liquid films via selection of the substrate chemical properties.
AB - The viscosity of thin films of liquid poly(dimethylsiloxane) have been studied on silicon and fluoropolymer-coated silicon by means of a perturbation technique applied using colloid probe atomic force microscopy. The liquid film supported by a silicon substrate exhibited a greater viscosity than the bulk liquid, due to the strong interaction between the molecules near to the liquid/solid interface. In comparison, the liquid film supported by a fluoropolymer-coated substrate exhibited a similar viscosity to the bulk liquid, due to the weak interaction between the liquid and the fluoropolymer surface. This demonstrates the possibility to control the viscosity of thin liquid films via selection of the substrate chemical properties.
KW - Poly(dimethylsiloxane)
KW - Thin film
KW - Viscosity
KW - Fluoropolymer
KW - Atomic force microscopy
U2 - 10.1016/j.colsurfa.2012.11.013
DO - 10.1016/j.colsurfa.2012.11.013
M3 - Journal article
VL - 418
SP - 112
EP - 116
JO - Colloids and Surfaces A: Physicochemical and Engineering Aspects
JF - Colloids and Surfaces A: Physicochemical and Engineering Aspects
SN - 0927-7757
ER -