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Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields

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Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields. / Engelberg, Eliyahu Zvi; Paszkiewicz, Jan; Peacock, Ruth et al.
In: Physical Review Accelerators and Beams, Vol. 23, No. 12, 17.12.2020.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Engelberg, EZ, Paszkiewicz, J, Peacock, R, Lachmann, S, Ashkenazy, Y & Wuensch, W 2020, 'Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields', Physical Review Accelerators and Beams, vol. 23, no. 12. https://doi.org/10.1103/PhysRevAccelBeams.23.123501

APA

Engelberg, E. Z., Paszkiewicz, J., Peacock, R., Lachmann, S., Ashkenazy, Y., & Wuensch, W. (2020). Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields. Physical Review Accelerators and Beams, 23(12). https://doi.org/10.1103/PhysRevAccelBeams.23.123501

Vancouver

Engelberg EZ, Paszkiewicz J, Peacock R, Lachmann S, Ashkenazy Y, Wuensch W. Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields. Physical Review Accelerators and Beams. 2020 Dec 17;23(12). doi: 10.1103/PhysRevAccelBeams.23.123501

Author

Engelberg, Eliyahu Zvi ; Paszkiewicz, Jan ; Peacock, Ruth et al. / Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields. In: Physical Review Accelerators and Beams. 2020 ; Vol. 23, No. 12.

Bibtex

@article{34cf37a6319b4163a05ff75e4e9ca8ad,
title = "Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields",
abstract = "Breakdown of metals subject to intense electric fields is a long-standing limiting factor in high-voltage applications. The mechanism leading to breakdown nucleation is not completely understood. Previously, it was suggested that breakdown can be nucleated by a critical transition in the population of mobile dislocations near the surface of electrodes. This was formulated in terms of a mean-field mobile dislocation density fluctuation (MDDF) model. Based on this model, it was proposed that prebreakdown fluctuations of the mobile dislocation density might be observed as spikes in the dark current between the electrodes. We constructed a setup in which these fluctuations were measured. The rate of fluctuations, as a function of the electric field between the electrodes, agrees with the predictions of the MDDF model, both in functional form and in absolute numerical rates. This numerical agreement was obtained using previously derived numerical parameters of the model. In addition, for each electric field, the distribution of times between current fluctuations was examined. The results indicate that each such prebreakdown fluctuation is the result of a two-step process. This characteristic, too, is in line with the MDDF model, which predicts that a characteristic prebreakdown current event is described as two separate steps in a Markov process, occurring in quick succession.",
author = "Engelberg, {Eliyahu Zvi} and Jan Paszkiewicz and Ruth Peacock and Sagy Lachmann and Yinon Ashkenazy and Walter Wuensch",
year = "2020",
month = dec,
day = "17",
doi = "10.1103/PhysRevAccelBeams.23.123501",
language = "English",
volume = "23",
journal = "Physical Review Accelerators and Beams",
issn = "2469-9888",
publisher = "American Physical Society",
number = "12",

}

RIS

TY - JOUR

T1 - Dark current spikes as an indicator of mobile dislocation dynamics under intense dc electric fields

AU - Engelberg, Eliyahu Zvi

AU - Paszkiewicz, Jan

AU - Peacock, Ruth

AU - Lachmann, Sagy

AU - Ashkenazy, Yinon

AU - Wuensch, Walter

PY - 2020/12/17

Y1 - 2020/12/17

N2 - Breakdown of metals subject to intense electric fields is a long-standing limiting factor in high-voltage applications. The mechanism leading to breakdown nucleation is not completely understood. Previously, it was suggested that breakdown can be nucleated by a critical transition in the population of mobile dislocations near the surface of electrodes. This was formulated in terms of a mean-field mobile dislocation density fluctuation (MDDF) model. Based on this model, it was proposed that prebreakdown fluctuations of the mobile dislocation density might be observed as spikes in the dark current between the electrodes. We constructed a setup in which these fluctuations were measured. The rate of fluctuations, as a function of the electric field between the electrodes, agrees with the predictions of the MDDF model, both in functional form and in absolute numerical rates. This numerical agreement was obtained using previously derived numerical parameters of the model. In addition, for each electric field, the distribution of times between current fluctuations was examined. The results indicate that each such prebreakdown fluctuation is the result of a two-step process. This characteristic, too, is in line with the MDDF model, which predicts that a characteristic prebreakdown current event is described as two separate steps in a Markov process, occurring in quick succession.

AB - Breakdown of metals subject to intense electric fields is a long-standing limiting factor in high-voltage applications. The mechanism leading to breakdown nucleation is not completely understood. Previously, it was suggested that breakdown can be nucleated by a critical transition in the population of mobile dislocations near the surface of electrodes. This was formulated in terms of a mean-field mobile dislocation density fluctuation (MDDF) model. Based on this model, it was proposed that prebreakdown fluctuations of the mobile dislocation density might be observed as spikes in the dark current between the electrodes. We constructed a setup in which these fluctuations were measured. The rate of fluctuations, as a function of the electric field between the electrodes, agrees with the predictions of the MDDF model, both in functional form and in absolute numerical rates. This numerical agreement was obtained using previously derived numerical parameters of the model. In addition, for each electric field, the distribution of times between current fluctuations was examined. The results indicate that each such prebreakdown fluctuation is the result of a two-step process. This characteristic, too, is in line with the MDDF model, which predicts that a characteristic prebreakdown current event is described as two separate steps in a Markov process, occurring in quick succession.

U2 - 10.1103/PhysRevAccelBeams.23.123501

DO - 10.1103/PhysRevAccelBeams.23.123501

M3 - Journal article

VL - 23

JO - Physical Review Accelerators and Beams

JF - Physical Review Accelerators and Beams

SN - 2469-9888

IS - 12

ER -