Home > Research > Publications & Outputs > Dependable Embedded Systems Special Day Panel

Research

Associated organisational units

Links

Text available via DOI:

View graph of relations

Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Published

Standard

Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. / Suri, Neeraj; Fetzer, Christof; Abraham, Jacob A. et al.
2008 Design, Automation and Test in Europe. IEEE, 2008.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Suri, N, Fetzer, C, Abraham, JA, Poledna, S, Mendelson, A & Mitra, S 2008, Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. in 2008 Design, Automation and Test in Europe. IEEE. https://doi.org/10.1109/DATE.2008.4484868

APA

Suri, N., Fetzer, C., Abraham, J. A., Poledna, S., Mendelson, A., & Mitra, S. (2008). Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. In 2008 Design, Automation and Test in Europe IEEE. https://doi.org/10.1109/DATE.2008.4484868

Vancouver

Suri N, Fetzer C, Abraham JA, Poledna S, Mendelson A, Mitra S. Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. In 2008 Design, Automation and Test in Europe. IEEE. 2008 doi: 10.1109/DATE.2008.4484868

Author

Suri, Neeraj ; Fetzer, Christof ; Abraham, Jacob A. et al. / Dependable Embedded Systems Special Day Panel : Issues and Challenges in Dependable Embedded Systems. 2008 Design, Automation and Test in Europe. IEEE, 2008.

Bibtex

@inproceedings{b3f34de2739044a8aa87d32a80f68b6b,
title = "Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems.",
abstract = "The paper presents a panel discussion on the issues and challenges in dependable embedded system from both the academic and industrial perspectives. The panelists are Jacob Abraham from the University of Texas at Austin-USA, Stefan Poledna from TTTech-Austria, Avi Mendelson from Intel-Israel, and Subhasish Mitra from Stanford University-USA.",
author = "Neeraj Suri and Christof Fetzer and Abraham, {Jacob A.} and Stefan Poledna and Avi Mendelson and Subhasish Mitra",
year = "2008",
doi = "10.1109/DATE.2008.4484868",
language = "English",
isbn = "9783981080131",
booktitle = "2008 Design, Automation and Test in Europe",
publisher = "IEEE",

}

RIS

TY - GEN

T1 - Dependable Embedded Systems Special Day Panel

T2 - Issues and Challenges in Dependable Embedded Systems.

AU - Suri, Neeraj

AU - Fetzer, Christof

AU - Abraham, Jacob A.

AU - Poledna, Stefan

AU - Mendelson, Avi

AU - Mitra, Subhasish

PY - 2008

Y1 - 2008

N2 - The paper presents a panel discussion on the issues and challenges in dependable embedded system from both the academic and industrial perspectives. The panelists are Jacob Abraham from the University of Texas at Austin-USA, Stefan Poledna from TTTech-Austria, Avi Mendelson from Intel-Israel, and Subhasish Mitra from Stanford University-USA.

AB - The paper presents a panel discussion on the issues and challenges in dependable embedded system from both the academic and industrial perspectives. The panelists are Jacob Abraham from the University of Texas at Austin-USA, Stefan Poledna from TTTech-Austria, Avi Mendelson from Intel-Israel, and Subhasish Mitra from Stanford University-USA.

U2 - 10.1109/DATE.2008.4484868

DO - 10.1109/DATE.2008.4484868

M3 - Conference contribution/Paper

SN - 9783981080131

BT - 2008 Design, Automation and Test in Europe

PB - IEEE

ER -