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Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm. / Adams, Jamie; Joyce, Malcolm; Mellor, M.
In: Applied Radiation and Isotopes, Vol. 70, No. 7, 07.2012, p. 1150–1153.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Adams, J, Joyce, M & Mellor, M 2012, 'Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm', Applied Radiation and Isotopes, vol. 70, no. 7, pp. 1150–1153. https://doi.org/10.1016/j.apradiso.2011.11.033

APA

Adams, J., Joyce, M., & Mellor, M. (2012). Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm. Applied Radiation and Isotopes, 70(7), 1150–1153. https://doi.org/10.1016/j.apradiso.2011.11.033

Vancouver

Adams J, Joyce M, Mellor M. Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm. Applied Radiation and Isotopes. 2012 Jul;70(7):1150–1153. doi: 10.1016/j.apradiso.2011.11.033

Author

Adams, Jamie ; Joyce, Malcolm ; Mellor, M. / Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm. In: Applied Radiation and Isotopes. 2012 ; Vol. 70, No. 7. pp. 1150–1153.

Bibtex

@article{d929dd38bc5d4400b06b5f759f6ce696,
title = "Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm",
abstract = "A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A γ-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to anon-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm. ",
keywords = "Depth profiling, Radioactive contamination, Gamma spectrometry, Cadmium telluride, Principal component analysis, Shielding",
author = "Jamie Adams and Malcolm Joyce and M. Mellor",
year = "2012",
month = jul,
doi = "10.1016/j.apradiso.2011.11.033",
language = "English",
volume = "70",
pages = "1150–1153",
journal = "Applied Radiation and Isotopes",
issn = "0969-8043",
publisher = "Elsevier Limited",
number = "7",

}

RIS

TY - JOUR

T1 - Depth profiling 137Cs and 60Co non-intrusively for a suite of industrial shielding materials and at depths beyond 50mm

AU - Adams, Jamie

AU - Joyce, Malcolm

AU - Mellor, M.

PY - 2012/7

Y1 - 2012/7

N2 - A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A γ-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to anon-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm.

AB - A phantom has been used to position two radiation sources, separately, when buried under dry-silica sand at depths between 5 and 50 mm. A γ-ray energy spectrum was then measured at every 1 mm depth. Principal component analysis has been conducted, which has led to anon-linear fit being established, allowing the depth of entrainment to be accurately inferred. The technique has been expanded for additional shielding media: water, aggregate and both wet and dry soil. The technique has also been expanded beyond the previous depth constraint of 50 mm.

KW - Depth profiling

KW - Radioactive contamination

KW - Gamma spectrometry

KW - Cadmium telluride

KW - Principal component analysis

KW - Shielding

U2 - 10.1016/j.apradiso.2011.11.033

DO - 10.1016/j.apradiso.2011.11.033

M3 - Journal article

VL - 70

SP - 1150

EP - 1153

JO - Applied Radiation and Isotopes

JF - Applied Radiation and Isotopes

SN - 0969-8043

IS - 7

ER -