Home > Research > Publications & Outputs > Depth profiling with Principle component Analys...
View graph of relations

Depth profiling with Principle component Analysis in a variety of contrasting media

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Published

Standard

Depth profiling with Principle component Analysis in a variety of contrasting media. / Adams, Jamie; Joyce, Malcolm; Mellor, Matthew.

2011. Paper presented at The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8), Kansas City, United States.

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Harvard

Adams, J, Joyce, M & Mellor, M 2011, 'Depth profiling with Principle component Analysis in a variety of contrasting media', Paper presented at The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8), Kansas City, United States, 19/12/11.

APA

Adams, J., Joyce, M., & Mellor, M. (2011). Depth profiling with Principle component Analysis in a variety of contrasting media. Paper presented at The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8), Kansas City, United States.

Vancouver

Adams J, Joyce M, Mellor M. Depth profiling with Principle component Analysis in a variety of contrasting media. 2011. Paper presented at The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8), Kansas City, United States.

Author

Adams, Jamie ; Joyce, Malcolm ; Mellor, Matthew. / Depth profiling with Principle component Analysis in a variety of contrasting media. Paper presented at The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8), Kansas City, United States.5 p.

Bibtex

@conference{26eb671b77b14a34b505682514101dbd,
title = "Depth profiling with Principle component Analysis in a variety of contrasting media",
author = "Jamie Adams and Malcolm Joyce and Matthew Mellor",
year = "2011",
language = "English",
note = "The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8) ; Conference date: 19-12-2011",

}

RIS

TY - CONF

T1 - Depth profiling with Principle component Analysis in a variety of contrasting media

AU - Adams, Jamie

AU - Joyce, Malcolm

AU - Mellor, Matthew

PY - 2011

Y1 - 2011

M3 - Conference paper

T2 - The 8th conference on Industrial Radiation and Radioisotope Measurement Applications (IRMMA8)

Y2 - 19 December 2011

ER -