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Development of class 1 QTAG monitor.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Standard

Development of class 1 QTAG monitor. / Bratt, Adrian; Baker, K.; Richardson, A. M. D. et al.
Proceedings of an international test conference: the next 25 years. IEEE Service Centre, 1994.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Bratt, A, Baker, K, Richardson, AMD & Welbers, A 1994, Development of class 1 QTAG monitor. in Proceedings of an international test conference: the next 25 years. IEEE Service Centre.

APA

Bratt, A., Baker, K., Richardson, A. M. D., & Welbers, A. (1994). Development of class 1 QTAG monitor. In Proceedings of an international test conference: the next 25 years IEEE Service Centre.

Vancouver

Bratt A, Baker K, Richardson AMD, Welbers A. Development of class 1 QTAG monitor. In Proceedings of an international test conference: the next 25 years. IEEE Service Centre. 1994

Author

Bratt, Adrian ; Baker, K. ; Richardson, A. M. D. et al. / Development of class 1 QTAG monitor. Proceedings of an international test conference: the next 25 years. IEEE Service Centre, 1994.

Bibtex

@inbook{a6f963d9c3974e3ca735a3eaba16416d,
title = "Development of class 1 QTAG monitor.",
author = "Adrian Bratt and K. Baker and Richardson, {A. M. D.} and A. Welbers",
year = "1994",
language = "English",
booktitle = "Proceedings of an international test conference: the next 25 years",
publisher = "IEEE Service Centre",

}

RIS

TY - CHAP

T1 - Development of class 1 QTAG monitor.

AU - Bratt, Adrian

AU - Baker, K.

AU - Richardson, A. M. D.

AU - Welbers, A.

PY - 1994

Y1 - 1994

M3 - Chapter

BT - Proceedings of an international test conference: the next 25 years

PB - IEEE Service Centre

ER -