Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
| Publication date | 8/11/2020 |
|---|---|
| Host publication | 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 |
| Publisher | IEEE Computer Society Press |
| Pages | 200-201 |
| Number of pages | 2 |
| ISBN (electronic) | 9781728166209 |
| <mark>Original language</mark> | English |
| Externally published | Yes |
| Event | 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States Duration: 8/11/2020 → 13/11/2020 |
| Conference | 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 |
|---|---|
| Country/Territory | United States |
| City | Virtual, Buffalo |
| Period | 8/11/20 → 13/11/20 |
| Name | International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz |
|---|---|
| Volume | 2020-November |
| ISSN (Print) | 2162-2027 |
| ISSN (electronic) | 2162-2035 |
| Conference | 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 |
|---|---|
| Country/Territory | United States |
| City | Virtual, Buffalo |
| Period | 8/11/20 → 13/11/20 |
We demonstrate how reflection terahertz time-domain spectroscopy (THz-TDS) can be used to measure conductivity of large area graphene films through silicon substrate. This through-substrate approach in turn allows an unhindered access to the graphene top surface and thus, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.