Standard
Expanding Fix Patterns to Enable Automatic Program Repair. /
Nowack, Vesna; Bowes, David; Counsell, Steve et al.
2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE). ed. / Zhi Jin; Xuandong Li; Jianwen Xiang; Leonardo Mariani; Ting Liu; Xiao Yu; Nahgmeh Ivaki. IEEE Computer Society Press, 2022. p. 12-23 (2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Nowack, V, Bowes, D, Counsell, S
, Hall, T, Haraldsson, S, Winter, E & Woodward, J 2022,
Expanding Fix Patterns to Enable Automatic Program Repair. in Z Jin, X Li, J Xiang, L Mariani, T Liu, X Yu & N Ivaki (eds),
2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE). 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE), IEEE Computer Society Press, pp. 12-23, 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021, Wuhan, China,
25/10/21.
https://doi.org/10.1109/ISSRE52982.2021.00015
APA
Nowack, V., Bowes, D., Counsell, S.
, Hall, T., Haraldsson, S., Winter, E., & Woodward, J. (2022).
Expanding Fix Patterns to Enable Automatic Program Repair. In Z. Jin, X. Li, J. Xiang, L. Mariani, T. Liu, X. Yu, & N. Ivaki (Eds.),
2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE) (pp. 12-23). (2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)). IEEE Computer Society Press.
https://doi.org/10.1109/ISSRE52982.2021.00015
Vancouver
Nowack V, Bowes D, Counsell S
, Hall T, Haraldsson S, Winter E et al.
Expanding Fix Patterns to Enable Automatic Program Repair. In Jin Z, Li X, Xiang J, Mariani L, Liu T, Yu X, Ivaki N, editors, 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE). IEEE Computer Society Press. 2022. p. 12-23. (2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)). Epub 2021 Oct 28. doi: 10.1109/ISSRE52982.2021.00015
Author
Nowack, Vesna ; Bowes, David ; Counsell, Steve et al. /
Expanding Fix Patterns to Enable Automatic Program Repair. 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE). editor / Zhi Jin ; Xuandong Li ; Jianwen Xiang ; Leonardo Mariani ; Ting Liu ; Xiao Yu ; Nahgmeh Ivaki. IEEE Computer Society Press, 2022. pp. 12-23 (2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)).
Bibtex
@inproceedings{56bcc475c7d64186915c6ca9acd99aa7,
title = "Expanding Fix Patterns to Enable Automatic Program Repair",
abstract = "Automatic Program Repair (APR) has been proposed to help developers and reduce the time spent repairing programs. Recent APR tools have applied learned templates (fix patterns) to fix code using knowledge from fixes successfully applied in the past. However, there is still no general agreement on the representation of fix patterns, making their application and comparison with a baseline difficult. As a consequence, it is also difficult to expand fix patterns and further enable APR. We automatically generate fix patterns from similar fixes and compare the generated fix patterns against a state-of-the-art taxonomy. Our automated approach splits fixes into smaller, method-level chunks and calculates their similarity. A threshold-based clustering algorithm groups similar chunks and finds matches with state-of-the-art fix patterns. In our evaluation, we present 33 clusters whose fix patterns were generated from the fixes of 835 Defects4J bugs. Of those 33 clusters, 22 matched a state-of-the-art taxonomy with good agreement. The remaining 11 clusters were thematically analysed and generated new fix patterns that expanded the taxonomy. Our new fix patterns should enable APR researchers and practitioners to expand their tools to fix a greater range of bugs in the future. ",
keywords = "Automatic program repair, Clustering, Fix pattern, Similarity metric",
author = "Vesna Nowack and David Bowes and Steve Counsell and Tracy Hall and Saemundur Haraldsson and Emily Winter and John Woodward",
year = "2022",
month = feb,
day = "11",
doi = "10.1109/ISSRE52982.2021.00015",
language = "English",
isbn = "9781665425889",
series = "2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)",
publisher = "IEEE Computer Society Press",
pages = "12--23",
editor = "Zhi Jin and Xuandong Li and Jianwen Xiang and Leonardo Mariani and Ting Liu and Xiao Yu and Nahgmeh Ivaki",
booktitle = "2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)",
note = "32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021 ; Conference date: 25-10-2021 Through 28-10-2021",
}
RIS
TY - GEN
T1 - Expanding Fix Patterns to Enable Automatic Program Repair
AU - Nowack, Vesna
AU - Bowes, David
AU - Counsell, Steve
AU - Hall, Tracy
AU - Haraldsson, Saemundur
AU - Winter, Emily
AU - Woodward, John
PY - 2022/2/11
Y1 - 2022/2/11
N2 - Automatic Program Repair (APR) has been proposed to help developers and reduce the time spent repairing programs. Recent APR tools have applied learned templates (fix patterns) to fix code using knowledge from fixes successfully applied in the past. However, there is still no general agreement on the representation of fix patterns, making their application and comparison with a baseline difficult. As a consequence, it is also difficult to expand fix patterns and further enable APR. We automatically generate fix patterns from similar fixes and compare the generated fix patterns against a state-of-the-art taxonomy. Our automated approach splits fixes into smaller, method-level chunks and calculates their similarity. A threshold-based clustering algorithm groups similar chunks and finds matches with state-of-the-art fix patterns. In our evaluation, we present 33 clusters whose fix patterns were generated from the fixes of 835 Defects4J bugs. Of those 33 clusters, 22 matched a state-of-the-art taxonomy with good agreement. The remaining 11 clusters were thematically analysed and generated new fix patterns that expanded the taxonomy. Our new fix patterns should enable APR researchers and practitioners to expand their tools to fix a greater range of bugs in the future.
AB - Automatic Program Repair (APR) has been proposed to help developers and reduce the time spent repairing programs. Recent APR tools have applied learned templates (fix patterns) to fix code using knowledge from fixes successfully applied in the past. However, there is still no general agreement on the representation of fix patterns, making their application and comparison with a baseline difficult. As a consequence, it is also difficult to expand fix patterns and further enable APR. We automatically generate fix patterns from similar fixes and compare the generated fix patterns against a state-of-the-art taxonomy. Our automated approach splits fixes into smaller, method-level chunks and calculates their similarity. A threshold-based clustering algorithm groups similar chunks and finds matches with state-of-the-art fix patterns. In our evaluation, we present 33 clusters whose fix patterns were generated from the fixes of 835 Defects4J bugs. Of those 33 clusters, 22 matched a state-of-the-art taxonomy with good agreement. The remaining 11 clusters were thematically analysed and generated new fix patterns that expanded the taxonomy. Our new fix patterns should enable APR researchers and practitioners to expand their tools to fix a greater range of bugs in the future.
KW - Automatic program repair
KW - Clustering
KW - Fix pattern
KW - Similarity metric
U2 - 10.1109/ISSRE52982.2021.00015
DO - 10.1109/ISSRE52982.2021.00015
M3 - Conference contribution/Paper
AN - SCOPUS:85126395598
SN - 9781665425889
T3 - 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)
SP - 12
EP - 23
BT - 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)
A2 - Jin, Zhi
A2 - Li, Xuandong
A2 - Xiang, Jianwen
A2 - Mariani, Leonardo
A2 - Liu, Ting
A2 - Yu, Xiao
A2 - Ivaki, Nahgmeh
PB - IEEE Computer Society Press
T2 - 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021
Y2 - 25 October 2021 through 28 October 2021
ER -
