Standard
Factors impacting the temperature dependence of soft errors in commercial SRAMs. / Bagatin, M.; Gerardin, S.; Paccagnella, A. et al.
2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008. IEEE, 2008. p. 100-106 5782693 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper
Harvard
Bagatin, M, Gerardin, S, Paccagnella, A, Andreani, C, Gorini, G, Pietropaolo, A
, Platt, SP & Frost, CD 2008,
Factors impacting the temperature dependence of soft errors in commercial SRAMs. in
2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008., 5782693, Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS, IEEE, pp. 100-106, 8th European Workshop on Radiation and Its Effects on Components and Systems, RADECS 2008, Jyvaskyla, Finland,
10/09/08.
https://doi.org/10.1109/RADECS.2008.5782693APA
Bagatin, M., Gerardin, S., Paccagnella, A., Andreani, C., Gorini, G., Pietropaolo, A.
, Platt, S. P., & Frost, C. D. (2008).
Factors impacting the temperature dependence of soft errors in commercial SRAMs. In
2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008 (pp. 100-106). Article 5782693 (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). IEEE.
https://doi.org/10.1109/RADECS.2008.5782693Vancouver
Bagatin M, Gerardin S, Paccagnella A, Andreani C, Gorini G, Pietropaolo A et al.
Factors impacting the temperature dependence of soft errors in commercial SRAMs. In 2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008. IEEE. 2008. p. 100-106. 5782693. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). doi: 10.1109/RADECS.2008.5782693
Author
Bibtex
@inproceedings{1035a9430382417b8c5545d224079201,
title = "Factors impacting the temperature dependence of soft errors in commercial SRAMs",
abstract = "We performed neutron and alpha-particle irradiation to reproduce the effects of the terrestrial environment on several commercial SRAMs manufactured by different vendors. We observed that, depending on the tested vendor, the number of errors either increases or slightly decreases for rising temperature, even in devices belonging to the same technology node. SPICE simulations were then used to investigate the temperature dependence of parameters like the feedback time and restoring current of the cell. The shape and magnitude of the particle-induced transient current was discussed as a function of temperature. The variability in the temperature response was attributed to the balance of contrasting factors, such as cell slowing down and increased diffusion collection with increasing temperature.",
keywords = "Neutrons, SPICE, SRAMs, Temperature Effects",
author = "M. Bagatin and S. Gerardin and A. Paccagnella and C. Andreani and G. Gorini and A. Pietropaolo and Platt, {S. P.} and Frost, {C. D.}",
year = "2008",
month = dec,
day = "1",
doi = "10.1109/RADECS.2008.5782693",
language = "English",
isbn = "9781457704819",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
publisher = "IEEE",
pages = "100--106",
booktitle = "2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008",
note = "8th European Workshop on Radiation and Its Effects on Components and Systems, RADECS 2008 ; Conference date: 10-09-2008 Through 12-09-2008",
}
RIS
TY - GEN
T1 - Factors impacting the temperature dependence of soft errors in commercial SRAMs
AU - Bagatin, M.
AU - Gerardin, S.
AU - Paccagnella, A.
AU - Andreani, C.
AU - Gorini, G.
AU - Pietropaolo, A.
AU - Platt, S. P.
AU - Frost, C. D.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - We performed neutron and alpha-particle irradiation to reproduce the effects of the terrestrial environment on several commercial SRAMs manufactured by different vendors. We observed that, depending on the tested vendor, the number of errors either increases or slightly decreases for rising temperature, even in devices belonging to the same technology node. SPICE simulations were then used to investigate the temperature dependence of parameters like the feedback time and restoring current of the cell. The shape and magnitude of the particle-induced transient current was discussed as a function of temperature. The variability in the temperature response was attributed to the balance of contrasting factors, such as cell slowing down and increased diffusion collection with increasing temperature.
AB - We performed neutron and alpha-particle irradiation to reproduce the effects of the terrestrial environment on several commercial SRAMs manufactured by different vendors. We observed that, depending on the tested vendor, the number of errors either increases or slightly decreases for rising temperature, even in devices belonging to the same technology node. SPICE simulations were then used to investigate the temperature dependence of parameters like the feedback time and restoring current of the cell. The shape and magnitude of the particle-induced transient current was discussed as a function of temperature. The variability in the temperature response was attributed to the balance of contrasting factors, such as cell slowing down and increased diffusion collection with increasing temperature.
KW - Neutrons
KW - SPICE
KW - SRAMs
KW - Temperature Effects
U2 - 10.1109/RADECS.2008.5782693
DO - 10.1109/RADECS.2008.5782693
M3 - Conference contribution/Paper
AN - SCOPUS:79960621428
SN - 9781457704819
T3 - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
SP - 100
EP - 106
BT - 2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008
PB - IEEE
T2 - 8th European Workshop on Radiation and Its Effects on Components and Systems, RADECS 2008
Y2 - 10 September 2008 through 12 September 2008
ER -
