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Fidelity of energy spectra at neutron facilities for single-event effects testing

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Fidelity of energy spectra at neutron facilities for single-event effects testing. / Platt, S. P.; Prokofiev, A. V.; Xiao, Cai Xiao.
2010 IEEE International Reliability Physics Symposium, IRPS 2010. IEEE, 2010. p. 411-416 5488795 (IEEE International Reliability Physics Symposium Proceedings).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Platt, SP, Prokofiev, AV & Xiao, CX 2010, Fidelity of energy spectra at neutron facilities for single-event effects testing. in 2010 IEEE International Reliability Physics Symposium, IRPS 2010., 5488795, IEEE International Reliability Physics Symposium Proceedings, IEEE, pp. 411-416, 2010 IEEE International Reliability Physics Symposium, IRPS 2010, Garden Grove, CA, Canada, 2/05/10. https://doi.org/10.1109/IRPS.2010.5488795

APA

Platt, S. P., Prokofiev, A. V., & Xiao, C. X. (2010). Fidelity of energy spectra at neutron facilities for single-event effects testing. In 2010 IEEE International Reliability Physics Symposium, IRPS 2010 (pp. 411-416). Article 5488795 (IEEE International Reliability Physics Symposium Proceedings). IEEE. https://doi.org/10.1109/IRPS.2010.5488795

Vancouver

Platt SP, Prokofiev AV, Xiao CX. Fidelity of energy spectra at neutron facilities for single-event effects testing. In 2010 IEEE International Reliability Physics Symposium, IRPS 2010. IEEE. 2010. p. 411-416. 5488795. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS.2010.5488795

Author

Platt, S. P. ; Prokofiev, A. V. ; Xiao, Cai Xiao. / Fidelity of energy spectra at neutron facilities for single-event effects testing. 2010 IEEE International Reliability Physics Symposium, IRPS 2010. IEEE, 2010. pp. 411-416 (IEEE International Reliability Physics Symposium Proceedings).

Bibtex

@inproceedings{e9e2791fd98241b892d089b974f05ea6,
title = "Fidelity of energy spectra at neutron facilities for single-event effects testing",
abstract = "We quantify the fidelity of neutron beam spectra for single-event effects accelerated testing. Beam spectra are folded with representative SEE cross-section curves and errors in predicted SEE rates are determined. The use of quasi-monoenergetic neutrons to complement spallation neutron sources is described. Errors can be controlled to insignificant levels even when the maximum neutron energy is below 200MeV.",
author = "Platt, {S. P.} and Prokofiev, {A. V.} and Xiao, {Cai Xiao}",
year = "2010",
month = oct,
day = "20",
doi = "10.1109/IRPS.2010.5488795",
language = "English",
isbn = "9781424454310",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "IEEE",
pages = "411--416",
booktitle = "2010 IEEE International Reliability Physics Symposium, IRPS 2010",
note = "2010 IEEE International Reliability Physics Symposium, IRPS 2010 ; Conference date: 02-05-2010 Through 06-05-2010",

}

RIS

TY - GEN

T1 - Fidelity of energy spectra at neutron facilities for single-event effects testing

AU - Platt, S. P.

AU - Prokofiev, A. V.

AU - Xiao, Cai Xiao

PY - 2010/10/20

Y1 - 2010/10/20

N2 - We quantify the fidelity of neutron beam spectra for single-event effects accelerated testing. Beam spectra are folded with representative SEE cross-section curves and errors in predicted SEE rates are determined. The use of quasi-monoenergetic neutrons to complement spallation neutron sources is described. Errors can be controlled to insignificant levels even when the maximum neutron energy is below 200MeV.

AB - We quantify the fidelity of neutron beam spectra for single-event effects accelerated testing. Beam spectra are folded with representative SEE cross-section curves and errors in predicted SEE rates are determined. The use of quasi-monoenergetic neutrons to complement spallation neutron sources is described. Errors can be controlled to insignificant levels even when the maximum neutron energy is below 200MeV.

U2 - 10.1109/IRPS.2010.5488795

DO - 10.1109/IRPS.2010.5488795

M3 - Conference contribution/Paper

AN - SCOPUS:77957917764

SN - 9781424454310

T3 - IEEE International Reliability Physics Symposium Proceedings

SP - 411

EP - 416

BT - 2010 IEEE International Reliability Physics Symposium, IRPS 2010

PB - IEEE

T2 - 2010 IEEE International Reliability Physics Symposium, IRPS 2010

Y2 - 2 May 2010 through 6 May 2010

ER -