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School of Engineering
Associated organisational unit
Engineering of Microwaves, Terahertz and Light (E-MIT)
Links
http://www.springerlink.com/content/w03p8076105r4928/
Text available via DOI:
https://doi.org/10.1007/s10836-007-5057-8
Final published version
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Guest Editorial
Research output
:
Contribution to Journal/Magazine
›
Editorial
›
peer-review
Published
Overview
Cite this
Marcelo Lubaszewski
(Editor)
Andrew Richardson
(Editor)
C. C. Su
(Editor)
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<mark>Journal publication date</mark>
12/2007
<mark>Journal</mark>
Journal of Electronic Testing
Issue number
6
Volume
23
Number of pages
1
Pages (from-to)
469-469
Publication Status
Published
<mark>Original language</mark>
English