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Imaging the permeability distribution of a layered conductor using inductance spectroscopy.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

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Imaging the permeability distribution of a layered conductor using inductance spectroscopy. / Yin, W.; Dickinson, S. J.; Peyton, A. J.

Proceedings of the 4th world congress on industrial process tomography. 2005. p. 720-725.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Harvard

Yin, W, Dickinson, SJ & Peyton, AJ 2005, Imaging the permeability distribution of a layered conductor using inductance spectroscopy. in Proceedings of the 4th world congress on industrial process tomography. pp. 720-725.

APA

Yin, W., Dickinson, S. J., & Peyton, A. J. (2005). Imaging the permeability distribution of a layered conductor using inductance spectroscopy. In Proceedings of the 4th world congress on industrial process tomography (pp. 720-725)

Vancouver

Yin W, Dickinson SJ, Peyton AJ. Imaging the permeability distribution of a layered conductor using inductance spectroscopy. In Proceedings of the 4th world congress on industrial process tomography. 2005. p. 720-725

Author

Yin, W. ; Dickinson, S. J. ; Peyton, A. J. / Imaging the permeability distribution of a layered conductor using inductance spectroscopy. Proceedings of the 4th world congress on industrial process tomography. 2005. pp. 720-725

Bibtex

@inbook{90f8e02e205d48d2a4a5933456797bca,
title = "Imaging the permeability distribution of a layered conductor using inductance spectroscopy.",
author = "W. Yin and Dickinson, {S. J.} and Peyton, {A. J.}",
year = "2005",
language = "English",
pages = "720--725",
booktitle = "Proceedings of the 4th world congress on industrial process tomography",

}

RIS

TY - CHAP

T1 - Imaging the permeability distribution of a layered conductor using inductance spectroscopy.

AU - Yin, W.

AU - Dickinson, S. J.

AU - Peyton, A. J.

PY - 2005

Y1 - 2005

M3 - Chapter

SP - 720

EP - 725

BT - Proceedings of the 4th world congress on industrial process tomography

ER -