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In-situ neutron dosimetry for single-event effect accelerated testing

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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In-situ neutron dosimetry for single-event effect accelerated testing. / Zhang, Lyn H.; Platt, S. P.; Edwards, R. H. et al.
In: IEEE Transactions on Nuclear Science, Vol. 56, No. 4, 5204744, 01.08.2009, p. 2070-2076.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Zhang, LH, Platt, SP, Edwards, RH & Allabush, C 2009, 'In-situ neutron dosimetry for single-event effect accelerated testing', IEEE Transactions on Nuclear Science, vol. 56, no. 4, 5204744, pp. 2070-2076. https://doi.org/10.1109/TNS.2009.2013236

APA

Zhang, L. H., Platt, S. P., Edwards, R. H., & Allabush, C. (2009). In-situ neutron dosimetry for single-event effect accelerated testing. IEEE Transactions on Nuclear Science, 56(4), 2070-2076. Article 5204744. https://doi.org/10.1109/TNS.2009.2013236

Vancouver

Zhang LH, Platt SP, Edwards RH, Allabush C. In-situ neutron dosimetry for single-event effect accelerated testing. IEEE Transactions on Nuclear Science. 2009 Aug 1;56(4):2070-2076. 5204744. doi: 10.1109/TNS.2009.2013236

Author

Zhang, Lyn H. ; Platt, S. P. ; Edwards, R. H. et al. / In-situ neutron dosimetry for single-event effect accelerated testing. In: IEEE Transactions on Nuclear Science. 2009 ; Vol. 56, No. 4. pp. 2070-2076.

Bibtex

@article{fe52d5de020f4db08ef59ea9da25f06e,
title = "In-situ neutron dosimetry for single-event effect accelerated testing",
abstract = "We describe an in-situ fast neutron dosimetry system using silicon photodiodes, and discuss its application to accelerated testing for single-event effects (SEEs). Experimental data and theoretical analyses are presented and concept feasibility demonstrated.",
keywords = "Accelerated testing, Neutron beams, Neutron detectors, Single event effects",
author = "Zhang, {Lyn H.} and Platt, {S. P.} and Edwards, {R. H.} and C. Allabush",
year = "2009",
month = aug,
day = "1",
doi = "10.1109/TNS.2009.2013236",
language = "English",
volume = "56",
pages = "2070--2076",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC",
number = "4",

}

RIS

TY - JOUR

T1 - In-situ neutron dosimetry for single-event effect accelerated testing

AU - Zhang, Lyn H.

AU - Platt, S. P.

AU - Edwards, R. H.

AU - Allabush, C.

PY - 2009/8/1

Y1 - 2009/8/1

N2 - We describe an in-situ fast neutron dosimetry system using silicon photodiodes, and discuss its application to accelerated testing for single-event effects (SEEs). Experimental data and theoretical analyses are presented and concept feasibility demonstrated.

AB - We describe an in-situ fast neutron dosimetry system using silicon photodiodes, and discuss its application to accelerated testing for single-event effects (SEEs). Experimental data and theoretical analyses are presented and concept feasibility demonstrated.

KW - Accelerated testing

KW - Neutron beams

KW - Neutron detectors

KW - Single event effects

U2 - 10.1109/TNS.2009.2013236

DO - 10.1109/TNS.2009.2013236

M3 - Journal article

AN - SCOPUS:69649106109

VL - 56

SP - 2070

EP - 2076

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

SN - 0018-9499

IS - 4

M1 - 5204744

ER -