Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

School of Engineering

Associated organisational unit

Engineering of Microwaves, Terahertz and Light (E-MIT)

Research output: Contribution to Journal/Magazine › Journal article

Published

Standard

Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers. / Burbidge, Martin J.; Tijou, Jim; Richardson, Andrew M. D.
In: Journal of Electronic Testing, 2003.

Research output: Contribution to Journal/Magazine › Journal article

Bibtex

@article{e67a80a55aad4475af9be9c812474529,

title = "Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.",

author = "Burbidge, {Martin J.} and Jim Tijou and Richardson, {Andrew M. D.}",

year = "2003",

language = "English",

journal = "Journal of Electronic Testing",

issn = "0923-8174",

publisher = "Springer Netherlands",

}

RIS

TY - JOUR

T1 - Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.

AU - Burbidge, Martin J.

AU - Tijou, Jim

AU - Richardson, Andrew M. D.

PY - 2003

Y1 - 2003

M3 - Journal article

JO - Journal of Electronic Testing

JF - Journal of Electronic Testing

SN - 0923-8174

ER -

Research

Associated organisational unit