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Measurement of field-emission induced optical emission spectra

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Measurement of field-emission induced optical emission spectra. / Peacock, Ruth; Wuensch, Walter; Burt, Graeme.
2020. Paper presented at International Vacuum Electronics Conference (IVEC 2020).

Research output: Contribution to conference - Without ISBN/ISSN Conference paper

Harvard

Peacock, R, Wuensch, W & Burt, G 2020, 'Measurement of field-emission induced optical emission spectra', Paper presented at International Vacuum Electronics Conference (IVEC 2020), 19/10/20 - 22/10/20. https://doi.org/10.1109/IVNC49440.2020.9203211

APA

Peacock, R., Wuensch, W., & Burt, G. (2020). Measurement of field-emission induced optical emission spectra. Paper presented at International Vacuum Electronics Conference (IVEC 2020). https://doi.org/10.1109/IVNC49440.2020.9203211

Vancouver

Peacock R, Wuensch W, Burt G. Measurement of field-emission induced optical emission spectra. 2020. Paper presented at International Vacuum Electronics Conference (IVEC 2020). doi: 10.1109/IVNC49440.2020.9203211

Author

Peacock, Ruth ; Wuensch, Walter ; Burt, Graeme. / Measurement of field-emission induced optical emission spectra. Paper presented at International Vacuum Electronics Conference (IVEC 2020).

Bibtex

@conference{a966df3ea6c04b1e88a539e048996bc7,
title = "Measurement of field-emission induced optical emission spectra",
abstract = "Field-emission induced optical spectra have been measured from between to two electrically biased parallel copper electrodes. The measured light intensity of the optical spectra has a strong correlation with the current in the gap as the supply voltage is increased and a characteristic broadband spectrum between 550nm and 850nm. The spectrum also has some variation in intensity at different wavelengths depending on the angle of observation. Possible causes of this light include black body radiation, optical transition radiation and cathode luminescence. Further work is ongoing to determine the cause of the optical spectra, to potentially provide insight into the characteristics and evolution of emission sites.",
author = "Ruth Peacock and Walter Wuensch and Graeme Burt",
year = "2020",
month = sep,
day = "22",
doi = "10.1109/IVNC49440.2020.9203211",
language = "English",
note = "International Vacuum Electronics Conference (IVEC 2020) ; Conference date: 19-10-2020 Through 22-10-2020",

}

RIS

TY - CONF

T1 - Measurement of field-emission induced optical emission spectra

AU - Peacock, Ruth

AU - Wuensch, Walter

AU - Burt, Graeme

PY - 2020/9/22

Y1 - 2020/9/22

N2 - Field-emission induced optical spectra have been measured from between to two electrically biased parallel copper electrodes. The measured light intensity of the optical spectra has a strong correlation with the current in the gap as the supply voltage is increased and a characteristic broadband spectrum between 550nm and 850nm. The spectrum also has some variation in intensity at different wavelengths depending on the angle of observation. Possible causes of this light include black body radiation, optical transition radiation and cathode luminescence. Further work is ongoing to determine the cause of the optical spectra, to potentially provide insight into the characteristics and evolution of emission sites.

AB - Field-emission induced optical spectra have been measured from between to two electrically biased parallel copper electrodes. The measured light intensity of the optical spectra has a strong correlation with the current in the gap as the supply voltage is increased and a characteristic broadband spectrum between 550nm and 850nm. The spectrum also has some variation in intensity at different wavelengths depending on the angle of observation. Possible causes of this light include black body radiation, optical transition radiation and cathode luminescence. Further work is ongoing to determine the cause of the optical spectra, to potentially provide insight into the characteristics and evolution of emission sites.

U2 - 10.1109/IVNC49440.2020.9203211

DO - 10.1109/IVNC49440.2020.9203211

M3 - Conference paper

T2 - International Vacuum Electronics Conference (IVEC 2020)

Y2 - 19 October 2020 through 22 October 2020

ER -