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Monolithic integration of mid-infrared III-V semiconductor materials and devices onto silicon

Research output: ThesisDoctoral Thesis

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Monolithic integration of mid-infrared III-V semiconductor materials and devices onto silicon. / Delli, Evangelia.
Lancaster University, 2020. 250 p.

Research output: ThesisDoctoral Thesis

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Delli E. Monolithic integration of mid-infrared III-V semiconductor materials and devices onto silicon. Lancaster University, 2020. 250 p. doi: 10.17635/lancaster/thesis/907

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Bibtex

@phdthesis{83a5eb96279f4bf9be5b4bfb0d428be0,
title = "Monolithic integration of mid-infrared III-V semiconductor materials and devices onto silicon",
abstract = "Monolithic integration of antimonide (Sb) based semiconductors with silicon (Si) holds the potential for creating a new research area in mid-infrared (MIR) silicon photonics. This would impact over many fields including environmental monitoring, industrial process control, bio-medicine and homeland security. However, the significant material dissimilarities between III-V semiconductors and Si result in various crystal imperfections making direct epitaxial growth extremely difficult. This thesis reports on the development of new techniques to grow GaSb-based materials and devices directly onto Si wafers using molecular beam epitaxy (MBE). To begin with, a novel technique was developed using an efficient AlSb interfacial misfit array (IMF) combined with a two-temperature growth procedure to create a GaSb buffer layer. This was free of antiphase domains and exhibited a surface dislocation density of 2 x 108 cm-2. Next, GaSb-based dislocation filter superlattice (DFSL) structures were developed to further improve the material quality which resulted in a surface defect density as low as 6 x 106 cm-2. MIR InAsSb light emitting diodes were fabricated on Si using the two-step GaSb buffer layer which exhibited bright electroluminescence at room temperature peaking at around 4.5 μm. A new growth strategy was also developed to grow InAs layers on Si using the two-step GaSb buffer. Subsequently high crystalline quality InAsSb/InAs/Si multi-quantum wells were grown which demonstrated bright photoluminescence up to 300 K. Finally, a high performance type-II InAs/InAsSb superlattice barrier photodetector was grown on Si using a GaSb/AlSb DFSL structure. The device exhibited an extended MIR 50 % cut-off wavelength at around 5.2 µm and a maximum specific detectivity of 3.65 x 1010 Jones at 160 K. ",
keywords = "silicon photonics, mid-infrared, Molecular Beam Epitaxy, Light emitting diodes, Quantum well, Photodetectors, Dislocation filtering, GaSb on Si, InAsSb, type-II superlattice",
author = "Evangelia Delli",
year = "2020",
month = mar,
doi = "10.17635/lancaster/thesis/907",
language = "English",
publisher = "Lancaster University",
school = "Lancaster University",

}

RIS

TY - BOOK

T1 - Monolithic integration of mid-infrared III-V semiconductor materials and devices onto silicon

AU - Delli, Evangelia

PY - 2020/3

Y1 - 2020/3

N2 - Monolithic integration of antimonide (Sb) based semiconductors with silicon (Si) holds the potential for creating a new research area in mid-infrared (MIR) silicon photonics. This would impact over many fields including environmental monitoring, industrial process control, bio-medicine and homeland security. However, the significant material dissimilarities between III-V semiconductors and Si result in various crystal imperfections making direct epitaxial growth extremely difficult. This thesis reports on the development of new techniques to grow GaSb-based materials and devices directly onto Si wafers using molecular beam epitaxy (MBE). To begin with, a novel technique was developed using an efficient AlSb interfacial misfit array (IMF) combined with a two-temperature growth procedure to create a GaSb buffer layer. This was free of antiphase domains and exhibited a surface dislocation density of 2 x 108 cm-2. Next, GaSb-based dislocation filter superlattice (DFSL) structures were developed to further improve the material quality which resulted in a surface defect density as low as 6 x 106 cm-2. MIR InAsSb light emitting diodes were fabricated on Si using the two-step GaSb buffer layer which exhibited bright electroluminescence at room temperature peaking at around 4.5 μm. A new growth strategy was also developed to grow InAs layers on Si using the two-step GaSb buffer. Subsequently high crystalline quality InAsSb/InAs/Si multi-quantum wells were grown which demonstrated bright photoluminescence up to 300 K. Finally, a high performance type-II InAs/InAsSb superlattice barrier photodetector was grown on Si using a GaSb/AlSb DFSL structure. The device exhibited an extended MIR 50 % cut-off wavelength at around 5.2 µm and a maximum specific detectivity of 3.65 x 1010 Jones at 160 K.

AB - Monolithic integration of antimonide (Sb) based semiconductors with silicon (Si) holds the potential for creating a new research area in mid-infrared (MIR) silicon photonics. This would impact over many fields including environmental monitoring, industrial process control, bio-medicine and homeland security. However, the significant material dissimilarities between III-V semiconductors and Si result in various crystal imperfections making direct epitaxial growth extremely difficult. This thesis reports on the development of new techniques to grow GaSb-based materials and devices directly onto Si wafers using molecular beam epitaxy (MBE). To begin with, a novel technique was developed using an efficient AlSb interfacial misfit array (IMF) combined with a two-temperature growth procedure to create a GaSb buffer layer. This was free of antiphase domains and exhibited a surface dislocation density of 2 x 108 cm-2. Next, GaSb-based dislocation filter superlattice (DFSL) structures were developed to further improve the material quality which resulted in a surface defect density as low as 6 x 106 cm-2. MIR InAsSb light emitting diodes were fabricated on Si using the two-step GaSb buffer layer which exhibited bright electroluminescence at room temperature peaking at around 4.5 μm. A new growth strategy was also developed to grow InAs layers on Si using the two-step GaSb buffer. Subsequently high crystalline quality InAsSb/InAs/Si multi-quantum wells were grown which demonstrated bright photoluminescence up to 300 K. Finally, a high performance type-II InAs/InAsSb superlattice barrier photodetector was grown on Si using a GaSb/AlSb DFSL structure. The device exhibited an extended MIR 50 % cut-off wavelength at around 5.2 µm and a maximum specific detectivity of 3.65 x 1010 Jones at 160 K.

KW - silicon photonics

KW - mid-infrared

KW - Molecular Beam Epitaxy

KW - Light emitting diodes

KW - Quantum well

KW - Photodetectors

KW - Dislocation filtering

KW - GaSb on Si

KW - InAsSb

KW - type-II superlattice

U2 - 10.17635/lancaster/thesis/907

DO - 10.17635/lancaster/thesis/907

M3 - Doctoral Thesis

PB - Lancaster University

ER -