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Nonlinear yield analysis and optimization of monolithic microwave integrated circuits

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Nonlinear yield analysis and optimization of monolithic microwave integrated circuits. / DAGOSTINO, S ; PAOLONI, C .
In: IEEE Transactions on Microwave Theory and Techniques, Vol. 43, No. 10, 10.1995, p. 2504-2507.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

DAGOSTINO, S & PAOLONI, C 1995, 'Nonlinear yield analysis and optimization of monolithic microwave integrated circuits', IEEE Transactions on Microwave Theory and Techniques, vol. 43, no. 10, pp. 2504-2507. https://doi.org/10.1109/22.466189

APA

DAGOSTINO, S., & PAOLONI, C. (1995). Nonlinear yield analysis and optimization of monolithic microwave integrated circuits. IEEE Transactions on Microwave Theory and Techniques, 43(10), 2504-2507. https://doi.org/10.1109/22.466189

Vancouver

DAGOSTINO S, PAOLONI C. Nonlinear yield analysis and optimization of monolithic microwave integrated circuits. IEEE Transactions on Microwave Theory and Techniques. 1995 Oct;43(10):2504-2507. doi: 10.1109/22.466189

Author

DAGOSTINO, S ; PAOLONI, C . / Nonlinear yield analysis and optimization of monolithic microwave integrated circuits. In: IEEE Transactions on Microwave Theory and Techniques. 1995 ; Vol. 43, No. 10. pp. 2504-2507.

Bibtex

@article{4c8c50d956c74f739b355927aed13c39,
title = "Nonlinear yield analysis and optimization of monolithic microwave integrated circuits",
abstract = "In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters, One of the main features of the model is the easy and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantages of lumped-element MESFET model, in particular fast computation end reduction of convergence problems in harmonic balance for complex circuit topologies.",
author = "S DAGOSTINO and C PAOLONI",
year = "1995",
month = oct,
doi = "10.1109/22.466189",
language = "English",
volume = "43",
pages = "2504--2507",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "10",

}

RIS

TY - JOUR

T1 - Nonlinear yield analysis and optimization of monolithic microwave integrated circuits

AU - DAGOSTINO, S

AU - PAOLONI, C

PY - 1995/10

Y1 - 1995/10

N2 - In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters, One of the main features of the model is the easy and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantages of lumped-element MESFET model, in particular fast computation end reduction of convergence problems in harmonic balance for complex circuit topologies.

AB - In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters, One of the main features of the model is the easy and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantages of lumped-element MESFET model, in particular fast computation end reduction of convergence problems in harmonic balance for complex circuit topologies.

U2 - 10.1109/22.466189

DO - 10.1109/22.466189

M3 - Journal article

VL - 43

SP - 2504

EP - 2507

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

SN - 0018-9480

IS - 10

ER -