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Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient

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Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient. / Major, J.D.; Proskuryakov, Y.Y.; Durose, K. et al.
In: Thin Solid Films, Vol. 515, No. 15, 31.05.2007, p. 5828-5832.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Major, JD, Proskuryakov, YY, Durose, K & Green, S 2007, 'Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient', Thin Solid Films, vol. 515, no. 15, pp. 5828-5832. https://doi.org/10.1016/j.tsf.2006.12.169

APA

Major, J. D., Proskuryakov, Y. Y., Durose, K., & Green, S. (2007). Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient. Thin Solid Films, 515(15), 5828-5832. https://doi.org/10.1016/j.tsf.2006.12.169

Vancouver

Major JD, Proskuryakov YY, Durose K, Green S. Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient. Thin Solid Films. 2007 May 31;515(15):5828-5832. doi: 10.1016/j.tsf.2006.12.169

Author

Major, J.D. ; Proskuryakov, Y.Y. ; Durose, K. et al. / Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient. In: Thin Solid Films. 2007 ; Vol. 515, No. 15. pp. 5828-5832.

Bibtex

@article{679754da3107490a972dc49f4de09fc8,
title = "Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient",
abstract = "The early stages of the close-space sublimation growth of CdTe/ITO (indium tin oxide) at 500°C under 26.7 kPa (200 Torr) of N2 were investigated, the relatively high pressure being used to slow the growth. Film development was monitored over 60 mins by ex-situ AFM (atomic force microscopy), the growth being controlled by a shutter. The films formed by the {\textquoteleft}island{\textquoteright} or Volmer–Weber growth mechanism. Developments in the areal island growth rate, the island density and spatial distribution type were explained using growth mechanisms. Significant changes in these phenomena at t ≥ 10 mins were attributed to a change in growth mechanism from surface migration limited, to a regime in which island coalescence and direct impingement of vapour species on the islands became important. Since the islands are characterised by distinct crystalline facets, this indicates the growth mechanism to be uninterrupted step-flow like addition of material to each island. Arguments are given to relate the final grain size in the films to the density of nuclei that are stable to re-evaporation after t = 10 mins.",
keywords = "CdTe, Thin film , Nucleation , Solar",
author = "J.D. Major and Y.Y. Proskuryakov and K. Durose and S. Green",
note = "<ce:title>Proceedings of Sympodium O on Thin Film Chalcogenide Photovoltaic Materials, EMRS 2006 Conference</ce:title> <ce:subtitle>EMRS 2006 Symposium O</ce:subtitle>",
year = "2007",
month = may,
day = "31",
doi = "10.1016/j.tsf.2006.12.169",
language = "English",
volume = "515",
pages = "5828--5832",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",
number = "15",

}

RIS

TY - JOUR

T1 - Nucleation of CdTe thin films deposited by close-space sublimation under a nitrogen ambient

AU - Major, J.D.

AU - Proskuryakov, Y.Y.

AU - Durose, K.

AU - Green, S.

N1 - <ce:title>Proceedings of Sympodium O on Thin Film Chalcogenide Photovoltaic Materials, EMRS 2006 Conference</ce:title> <ce:subtitle>EMRS 2006 Symposium O</ce:subtitle>

PY - 2007/5/31

Y1 - 2007/5/31

N2 - The early stages of the close-space sublimation growth of CdTe/ITO (indium tin oxide) at 500°C under 26.7 kPa (200 Torr) of N2 were investigated, the relatively high pressure being used to slow the growth. Film development was monitored over 60 mins by ex-situ AFM (atomic force microscopy), the growth being controlled by a shutter. The films formed by the ‘island’ or Volmer–Weber growth mechanism. Developments in the areal island growth rate, the island density and spatial distribution type were explained using growth mechanisms. Significant changes in these phenomena at t ≥ 10 mins were attributed to a change in growth mechanism from surface migration limited, to a regime in which island coalescence and direct impingement of vapour species on the islands became important. Since the islands are characterised by distinct crystalline facets, this indicates the growth mechanism to be uninterrupted step-flow like addition of material to each island. Arguments are given to relate the final grain size in the films to the density of nuclei that are stable to re-evaporation after t = 10 mins.

AB - The early stages of the close-space sublimation growth of CdTe/ITO (indium tin oxide) at 500°C under 26.7 kPa (200 Torr) of N2 were investigated, the relatively high pressure being used to slow the growth. Film development was monitored over 60 mins by ex-situ AFM (atomic force microscopy), the growth being controlled by a shutter. The films formed by the ‘island’ or Volmer–Weber growth mechanism. Developments in the areal island growth rate, the island density and spatial distribution type were explained using growth mechanisms. Significant changes in these phenomena at t ≥ 10 mins were attributed to a change in growth mechanism from surface migration limited, to a regime in which island coalescence and direct impingement of vapour species on the islands became important. Since the islands are characterised by distinct crystalline facets, this indicates the growth mechanism to be uninterrupted step-flow like addition of material to each island. Arguments are given to relate the final grain size in the films to the density of nuclei that are stable to re-evaporation after t = 10 mins.

KW - CdTe

KW - Thin film

KW - Nucleation

KW - Solar

U2 - 10.1016/j.tsf.2006.12.169

DO - 10.1016/j.tsf.2006.12.169

M3 - Journal article

VL - 515

SP - 5828

EP - 5832

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 15

ER -