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On dynamic delay and repeater insertion.

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On dynamic delay and repeater insertion. / Tenhunen, Hannu; Pamunuwa, Dinesh B.
IEEE International Symposium on Circuits and Systems, 2002. IEEE, 2002. p. 97-100.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Tenhunen, H & Pamunuwa, DB 2002, On dynamic delay and repeater insertion. in IEEE International Symposium on Circuits and Systems, 2002. IEEE, pp. 97-100. https://doi.org/10.1109/ISCAS.2002.1009786

APA

Tenhunen, H., & Pamunuwa, D. B. (2002). On dynamic delay and repeater insertion. In IEEE International Symposium on Circuits and Systems, 2002 (pp. 97-100). IEEE. https://doi.org/10.1109/ISCAS.2002.1009786

Vancouver

Tenhunen H, Pamunuwa DB. On dynamic delay and repeater insertion. In IEEE International Symposium on Circuits and Systems, 2002. IEEE. 2002. p. 97-100 doi: 10.1109/ISCAS.2002.1009786

Author

Tenhunen, Hannu ; Pamunuwa, Dinesh B. / On dynamic delay and repeater insertion. IEEE International Symposium on Circuits and Systems, 2002. IEEE, 2002. pp. 97-100

Bibtex

@inbook{43c6746cfeba4c4388fad49687ab0134,
title = "On dynamic delay and repeater insertion.",
abstract = "In deep sub-micron technologies, as the wires are placed ever closer and signal rise and fall times go into the sub-nano second region, increased crosstalk has implications on the data throughput and on signal integrity. Depending on the data correlation on the coupled lines, the delay can either decrease or increase. Here we show that in uniform coupled lines, the response for several important switching configurations has a dominant pole characteristic. This allows easy prediction for the average, worst-case and best-case delay of buffered lines. We show that the repeater numbering and sizing can be optimised to deal with crosstalk under different constraints to best match the application. Area and power issues are considered and all equations are checked against a dynamic circuit simulator (SPECTRE).",
author = "Hannu Tenhunen and Pamunuwa, {Dinesh B.}",
note = "{"}{\textcopyright}2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.{"} {"}This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.{"}",
year = "2002",
doi = "10.1109/ISCAS.2002.1009786",
language = "English",
isbn = "0-7803-7448-7",
pages = "97--100",
booktitle = "IEEE International Symposium on Circuits and Systems, 2002",
publisher = "IEEE",

}

RIS

TY - CHAP

T1 - On dynamic delay and repeater insertion.

AU - Tenhunen, Hannu

AU - Pamunuwa, Dinesh B.

N1 - "©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."

PY - 2002

Y1 - 2002

N2 - In deep sub-micron technologies, as the wires are placed ever closer and signal rise and fall times go into the sub-nano second region, increased crosstalk has implications on the data throughput and on signal integrity. Depending on the data correlation on the coupled lines, the delay can either decrease or increase. Here we show that in uniform coupled lines, the response for several important switching configurations has a dominant pole characteristic. This allows easy prediction for the average, worst-case and best-case delay of buffered lines. We show that the repeater numbering and sizing can be optimised to deal with crosstalk under different constraints to best match the application. Area and power issues are considered and all equations are checked against a dynamic circuit simulator (SPECTRE).

AB - In deep sub-micron technologies, as the wires are placed ever closer and signal rise and fall times go into the sub-nano second region, increased crosstalk has implications on the data throughput and on signal integrity. Depending on the data correlation on the coupled lines, the delay can either decrease or increase. Here we show that in uniform coupled lines, the response for several important switching configurations has a dominant pole characteristic. This allows easy prediction for the average, worst-case and best-case delay of buffered lines. We show that the repeater numbering and sizing can be optimised to deal with crosstalk under different constraints to best match the application. Area and power issues are considered and all equations are checked against a dynamic circuit simulator (SPECTRE).

U2 - 10.1109/ISCAS.2002.1009786

DO - 10.1109/ISCAS.2002.1009786

M3 - Chapter

SN - 0-7803-7448-7

SP - 97

EP - 100

BT - IEEE International Symposium on Circuits and Systems, 2002

PB - IEEE

ER -