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On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination

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On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. / Bowen, James; Cheneler, David; Walliman, Dominic et al.
In: Measurement Science and Technology, Vol. 21, No. 11, 115106, 11.2010.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Bowen, J, Cheneler, D, Walliman, D, Arkless, SG, Zhang, Z, Ward, MCL & Adams, MJ 2010, 'On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination', Measurement Science and Technology, vol. 21, no. 11, 115106. https://doi.org/10.1088/0957-0233/21/11/115106

APA

Bowen, J., Cheneler, D., Walliman, D., Arkless, S. G., Zhang, Z., Ward, M. C. L., & Adams, M. J. (2010). On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. Measurement Science and Technology, 21(11), Article 115106. https://doi.org/10.1088/0957-0233/21/11/115106

Vancouver

Bowen J, Cheneler D, Walliman D, Arkless SG, Zhang Z, Ward MCL et al. On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. Measurement Science and Technology. 2010 Nov;21(11):115106. doi: 10.1088/0957-0233/21/11/115106

Author

Bowen, James ; Cheneler, David ; Walliman, Dominic et al. / On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. In: Measurement Science and Technology. 2010 ; Vol. 21, No. 11.

Bibtex

@article{4353c9460ec344dda6081dc1d3922612,
title = "On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination",
abstract = "A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated.",
author = "James Bowen and David Cheneler and Dominic Walliman and Arkless, {Stuart G.} and Zhibing Zhang and Ward, {Michael C. L.} and Adams, {Michael J.}",
year = "2010",
month = nov,
doi = "10.1088/0957-0233/21/11/115106",
language = "English",
volume = "21",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "11",

}

RIS

TY - JOUR

T1 - On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination

AU - Bowen, James

AU - Cheneler, David

AU - Walliman, Dominic

AU - Arkless, Stuart G.

AU - Zhang, Zhibing

AU - Ward, Michael C. L.

AU - Adams, Michael J.

PY - 2010/11

Y1 - 2010/11

N2 - A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated.

AB - A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated.

U2 - 10.1088/0957-0233/21/11/115106

DO - 10.1088/0957-0233/21/11/115106

M3 - Journal article

VL - 21

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 11

M1 - 115106

ER -