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Overhead Comparison of Instrumentation Frameworks

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

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Overhead Comparison of Instrumentation Frameworks. / Reichelt, David Georg ; Bulej, Lubomír; Jung, Reiner et al.
ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering. New York: ACM, 2024. p. 249-256 (Companion of the International Conference on Performance Engineering).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

Harvard

Reichelt, DG, Bulej, L, Jung, R & Hoorn, AV 2024, Overhead Comparison of Instrumentation Frameworks. in ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering. Companion of the International Conference on Performance Engineering, ACM, New York, pp. 249-256.

APA

Reichelt, D. G., Bulej, L., Jung, R., & Hoorn, A. V. (2024). Overhead Comparison of Instrumentation Frameworks. In ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering (pp. 249-256). (Companion of the International Conference on Performance Engineering). ACM.

Vancouver

Reichelt DG, Bulej L, Jung R, Hoorn AV. Overhead Comparison of Instrumentation Frameworks. In ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering. New York: ACM. 2024. p. 249-256. (Companion of the International Conference on Performance Engineering).

Author

Reichelt, David Georg ; Bulej, Lubomír ; Jung, Reiner et al. / Overhead Comparison of Instrumentation Frameworks. ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering. New York : ACM, 2024. pp. 249-256 (Companion of the International Conference on Performance Engineering).

Bibtex

@inproceedings{96f50c575235409c911f3ae8595af193,
title = "Overhead Comparison of Instrumentation Frameworks",
abstract = "Application Performance Monitoring (APM) tools are used in the industry to gain insights, identify bottlenecks, and alert to issues related to software performance. The available APM tools generally differ in terms of functionality and licensing, but also in monitoring overhead, which should be minimized due to use in production deployments. One notable source of monitoring overhead is the instrumentation technology, which adds code to the system undertest to obtain monitoring data.Because there are many ways how to instrument applications, we study the overhead of five different instrumentation technologies (AspectJ, ByteBuddy, DiSL, Javassist, and pure source code instrumentation) in the context of the Kieker open-source monitoring framework, using the MooBench benchmark as the system under test. Our experiments reveal that ByteBuddy, DiSL, Javassist, and source instrumentation achieve low monitoring overhead, and are therefore most suitable for achieving generally low overhead in the monitoring of production systems.However, the lowest overhead may be achieved by different technologies, depending on the configuration and the execution environment (e.g., the JVM implementation or the processor architecture). The overhead may also change due to modifications of the instrumentation technology. Consequently, if having the lowest possible overhead is crucial, it is best to analyze the overhead in concrete scenarios, with specific fractions of monitored methods and in the execution environment that accurately reflects the deployment environment. To this end, our extensions of the Kieker framework and the MooBench benchmark enable repeated assessment of monitoring overhead in different scenarios.",
author = "Reichelt, {David Georg} and Lubom{\'i}r Bulej and Reiner Jung and Hoorn, {Andre van}",
year = "2024",
month = may,
day = "7",
language = "English",
series = "Companion of the International Conference on Performance Engineering",
publisher = "ACM",
pages = "249--256",
booktitle = "ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering",

}

RIS

TY - GEN

T1 - Overhead Comparison of Instrumentation Frameworks

AU - Reichelt, David Georg

AU - Bulej, Lubomír

AU - Jung, Reiner

AU - Hoorn, Andre van

PY - 2024/5/7

Y1 - 2024/5/7

N2 - Application Performance Monitoring (APM) tools are used in the industry to gain insights, identify bottlenecks, and alert to issues related to software performance. The available APM tools generally differ in terms of functionality and licensing, but also in monitoring overhead, which should be minimized due to use in production deployments. One notable source of monitoring overhead is the instrumentation technology, which adds code to the system undertest to obtain monitoring data.Because there are many ways how to instrument applications, we study the overhead of five different instrumentation technologies (AspectJ, ByteBuddy, DiSL, Javassist, and pure source code instrumentation) in the context of the Kieker open-source monitoring framework, using the MooBench benchmark as the system under test. Our experiments reveal that ByteBuddy, DiSL, Javassist, and source instrumentation achieve low monitoring overhead, and are therefore most suitable for achieving generally low overhead in the monitoring of production systems.However, the lowest overhead may be achieved by different technologies, depending on the configuration and the execution environment (e.g., the JVM implementation or the processor architecture). The overhead may also change due to modifications of the instrumentation technology. Consequently, if having the lowest possible overhead is crucial, it is best to analyze the overhead in concrete scenarios, with specific fractions of monitored methods and in the execution environment that accurately reflects the deployment environment. To this end, our extensions of the Kieker framework and the MooBench benchmark enable repeated assessment of monitoring overhead in different scenarios.

AB - Application Performance Monitoring (APM) tools are used in the industry to gain insights, identify bottlenecks, and alert to issues related to software performance. The available APM tools generally differ in terms of functionality and licensing, but also in monitoring overhead, which should be minimized due to use in production deployments. One notable source of monitoring overhead is the instrumentation technology, which adds code to the system undertest to obtain monitoring data.Because there are many ways how to instrument applications, we study the overhead of five different instrumentation technologies (AspectJ, ByteBuddy, DiSL, Javassist, and pure source code instrumentation) in the context of the Kieker open-source monitoring framework, using the MooBench benchmark as the system under test. Our experiments reveal that ByteBuddy, DiSL, Javassist, and source instrumentation achieve low monitoring overhead, and are therefore most suitable for achieving generally low overhead in the monitoring of production systems.However, the lowest overhead may be achieved by different technologies, depending on the configuration and the execution environment (e.g., the JVM implementation or the processor architecture). The overhead may also change due to modifications of the instrumentation technology. Consequently, if having the lowest possible overhead is crucial, it is best to analyze the overhead in concrete scenarios, with specific fractions of monitored methods and in the execution environment that accurately reflects the deployment environment. To this end, our extensions of the Kieker framework and the MooBench benchmark enable repeated assessment of monitoring overhead in different scenarios.

M3 - Conference contribution/Paper

T3 - Companion of the International Conference on Performance Engineering

SP - 249

EP - 256

BT - ICPE '24 Companion: Companion of the 15th ACM/SPEC International Conference on Performance Engineering

PB - ACM

CY - New York

ER -