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Photon radiation testing of commercially available off-the-shelf microcontroller devices

Research output: Contribution to Journal/MagazineLetterpeer-review

<mark>Journal publication date</mark>10/03/2012
<mark>Journal</mark>IEICE Electronics Express
Issue number5
Number of pages6
Pages (from-to)397-402
Publication StatusPublished
<mark>Original language</mark>English


The results of photon radiation testing of various microcontroller devices is described. This was testing was useful to select the microcontroller in a 6DOF MEMS-based INS. This systems is being developed for the in-vivo monitoring of tumour position during clinical radiotherapy treatments. This application requires a radiation-tolerant processor in order to perform appropriately in a radiotherapy environment. A phantom has been built to replicate the working conditions that the microcontroller devices are required to endure. Each time, a number of identical microcontroller devices have been exposed, in 5turn, to X-ray doses in excess of 50 Gy from a clinical radiotherapy LINAC.