Rights statement: This is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003
Accepted author manuscript, 3.48 MB, PDF document
Available under license: CC BY-NC-ND: Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
Final published version
Research output: Contribution to Journal/Magazine › Journal article › peer-review
Selecting suitable image dimensions for scanning probe microscopy. / Bowen, James; Cheneler, David.
In: Surfaces and Interfaces, Vol. 9, 12.2017, p. 133-142.Research output: Contribution to Journal/Magazine › Journal article › peer-review
}
TY - JOUR
T1 - Selecting suitable image dimensions for scanning probe microscopy
AU - Bowen, James
AU - Cheneler, David
N1 - This is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003
PY - 2017/12
Y1 - 2017/12
N2 - The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.
AB - The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.
KW - Atomic force microscopy
KW - Roughness
KW - Scanning probe microscopy
KW - Surface
KW - Topography
U2 - 10.1016/j.surfin.2017.09.003
DO - 10.1016/j.surfin.2017.09.003
M3 - Journal article
VL - 9
SP - 133
EP - 142
JO - Surfaces and Interfaces
JF - Surfaces and Interfaces
ER -