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    Rights statement: This is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003

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Selecting suitable image dimensions for scanning probe microscopy

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Selecting suitable image dimensions for scanning probe microscopy. / Bowen, James; Cheneler, David.

In: Surfaces and Interfaces, Vol. 9, 12.2017, p. 133-142.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Bowen, J & Cheneler, D 2017, 'Selecting suitable image dimensions for scanning probe microscopy', Surfaces and Interfaces, vol. 9, pp. 133-142. https://doi.org/10.1016/j.surfin.2017.09.003

APA

Bowen, J., & Cheneler, D. (2017). Selecting suitable image dimensions for scanning probe microscopy. Surfaces and Interfaces, 9, 133-142. https://doi.org/10.1016/j.surfin.2017.09.003

Vancouver

Bowen J, Cheneler D. Selecting suitable image dimensions for scanning probe microscopy. Surfaces and Interfaces. 2017 Dec;9:133-142. Epub 2017 Sep 12. doi: 10.1016/j.surfin.2017.09.003

Author

Bowen, James ; Cheneler, David. / Selecting suitable image dimensions for scanning probe microscopy. In: Surfaces and Interfaces. 2017 ; Vol. 9. pp. 133-142.

Bibtex

@article{704130b28d07455284855676c17377af,
title = "Selecting suitable image dimensions for scanning probe microscopy",
abstract = "The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films. ",
keywords = "Atomic force microscopy, Roughness, Scanning probe microscopy, Surface, Topography",
author = "James Bowen and David Cheneler",
note = "This is the author{\textquoteright}s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003",
year = "2017",
month = dec,
doi = "10.1016/j.surfin.2017.09.003",
language = "English",
volume = "9",
pages = "133--142",
journal = "Surfaces and Interfaces",

}

RIS

TY - JOUR

T1 - Selecting suitable image dimensions for scanning probe microscopy

AU - Bowen, James

AU - Cheneler, David

N1 - This is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003

PY - 2017/12

Y1 - 2017/12

N2 - The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.

AB - The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.

KW - Atomic force microscopy

KW - Roughness

KW - Scanning probe microscopy

KW - Surface

KW - Topography

U2 - 10.1016/j.surfin.2017.09.003

DO - 10.1016/j.surfin.2017.09.003

M3 - Journal article

VL - 9

SP - 133

EP - 142

JO - Surfaces and Interfaces

JF - Surfaces and Interfaces

ER -