Home > Research > Publications & Outputs > Simple frequency counting techniques for analys...

Research

View graph of relations

Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

Standard

Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs. / Burbidge, M. J.
Proceedings of the 2nd IEE integrated circuit test conference. 2004.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Harvard

Burbidge, MJ 2004, Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs. in Proceedings of the 2nd IEE integrated circuit test conference.

APA

Burbidge, M. J. (2004). Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs. In Proceedings of the 2nd IEE integrated circuit test conference

Vancouver

Burbidge MJ. Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs. In Proceedings of the 2nd IEE integrated circuit test conference. 2004

Author

Burbidge, M. J. / Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs. Proceedings of the 2nd IEE integrated circuit test conference. 2004.

Bibtex

@inbook{d07f57853deb4040826057c62af0f417,
title = "Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs.",
author = "Burbidge, {M. J.}",
year = "2004",
language = "English",
booktitle = "Proceedings of the 2nd IEE integrated circuit test conference",

}

RIS

TY - CHAP

T1 - Simple frequency counting techniques for analysis of VCO/CP-PLL coupled noise sensitivity in fully embedded CP-PLLs.

AU - Burbidge, M. J.

PY - 2004

Y1 - 2004

M3 - Chapter

BT - Proceedings of the 2nd IEE integrated circuit test conference

ER -