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Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Published

Standard

Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model. / Yin, W.; Peyton, A. J.; Dickinson, S. J.
Proceedings of the 20th IEEE instrumentation and measurement technology conference. Vol. 1 IEEE, 2003. p. 162-165.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Harvard

Yin, W, Peyton, AJ & Dickinson, SJ 2003, Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model. in Proceedings of the 20th IEEE instrumentation and measurement technology conference. vol. 1, IEEE, pp. 162-165. <http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=27183&arnumber=1208144&count=170&index=33>

APA

Yin, W., Peyton, A. J., & Dickinson, S. J. (2003). Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model. In Proceedings of the 20th IEEE instrumentation and measurement technology conference (Vol. 1, pp. 162-165). IEEE. http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=27183&arnumber=1208144&count=170&index=33

Vancouver

Yin W, Peyton AJ, Dickinson SJ. Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model. In Proceedings of the 20th IEEE instrumentation and measurement technology conference. Vol. 1. IEEE. 2003. p. 162-165

Author

Yin, W. ; Peyton, A. J. ; Dickinson, S. J. / Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model. Proceedings of the 20th IEEE instrumentation and measurement technology conference. Vol. 1 IEEE, 2003. pp. 162-165

Bibtex

@inbook{5415af57bf5442d8ba00f5ade98fb9f7,
title = "Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model.",
author = "W. Yin and Peyton, {A. J.} and Dickinson, {S. J.}",
note = "{"}{\textcopyright}2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.{"} {"}This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.{"}",
year = "2003",
language = "English",
isbn = "0780377052",
volume = "1",
pages = "162--165",
booktitle = "Proceedings of the 20th IEEE instrumentation and measurement technology conference",
publisher = "IEEE",

}

RIS

TY - CHAP

T1 - Simultaneous measurement of distance and thickness of a thin metal plate with an electromagnetic sensor using a simplified model.

AU - Yin, W.

AU - Peyton, A. J.

AU - Dickinson, S. J.

N1 - "©2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."

PY - 2003

Y1 - 2003

M3 - Chapter

SN - 0780377052

VL - 1

SP - 162

EP - 165

BT - Proceedings of the 20th IEEE instrumentation and measurement technology conference

PB - IEEE

ER -