Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
}
TY - GEN
T1 - Software defect prediction using static code metrics underestimates defect-proneness
AU - Gray, D.
AU - Bowes, D.
AU - Davey, N.
AU - Sun, Y.
AU - Christianson, B.
PY - 2010
Y1 - 2010
N2 - Many studies have been carried out to predict the presence of software code defects using static code metrics. Such studies typically report how a classifier performs with real world data, but usually no analysis of the predictions is carried out. An analysis of this kind may be worthwhile as it can illuminate the motivation behind the predictions and the severity of the misclassifications. This investigation involves a manual analysis of the predictions made by Support Vector Machine classifiers using data from the NASA Metrics Data Program repository. The findings show that the predictions are generally well motivated and that the classifiers were, on average, more “confident” in the predictions they made which were correct.
AB - Many studies have been carried out to predict the presence of software code defects using static code metrics. Such studies typically report how a classifier performs with real world data, but usually no analysis of the predictions is carried out. An analysis of this kind may be worthwhile as it can illuminate the motivation behind the predictions and the severity of the misclassifications. This investigation involves a manual analysis of the predictions made by Support Vector Machine classifiers using data from the NASA Metrics Data Program repository. The findings show that the predictions are generally well motivated and that the classifiers were, on average, more “confident” in the predictions they made which were correct.
U2 - 10.1109/IJCNN.2010.5596650
DO - 10.1109/IJCNN.2010.5596650
M3 - Conference contribution/Paper
SN - 9781424469178
SP - 1
EP - 7
BT - The 2010 International Joint Conference on Neural Networks (IJCNN)
PB - IEEE
ER -