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Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review
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TY - CONF
T1 - The application of IDDX test strategies in analogue and mixed signal IC's
AU - Richardson, Andrew
AU - Bratt, Adrian
AU - Baturone, I
AU - HUERTAS, J L
PY - 1995/6/22
Y1 - 1995/6/22
N2 - Supply Current Testing (IDDQ) has become an important defect oriented teststrategy for digital IC products. The technique takes advantage of the lowquiescent supply current drawn by static CMOS circuits relative to thecurrent consumption during state changes. However, in analogue andmixed signal IC’s this condition can rarely be observed, as in most circuits,steady state currents depend on the biasing conditions and the circuitdesign.This paper reviews analogue current monitoring proposals, investigatessome of the problems related to the use of these techniques and attempts tocategorise a number of analogue design styles against the probablesuitability for current testing methodologies.
AB - Supply Current Testing (IDDQ) has become an important defect oriented teststrategy for digital IC products. The technique takes advantage of the lowquiescent supply current drawn by static CMOS circuits relative to thecurrent consumption during state changes. However, in analogue andmixed signal IC’s this condition can rarely be observed, as in most circuits,steady state currents depend on the biasing conditions and the circuitdesign.This paper reviews analogue current monitoring proposals, investigatessome of the problems related to the use of these techniques and attempts tocategorise a number of analogue design styles against the probablesuitability for current testing methodologies.
KW - analogue test
KW - IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing
KW - mixed signal test
M3 - Conference paper
T2 - IEEE International Mixed Signal Test Workshop
Y2 - 20 June 1995 through 22 June 1995
ER -