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The application of IDDX test strategies in analogue and mixed signal IC's

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Published

Standard

The application of IDDX test strategies in analogue and mixed signal IC's. / Richardson, Andrew; Bratt, Adrian; Baturone, I et al.
1995. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

Harvard

Richardson, A, Bratt, A, Baturone, I & HUERTAS, JL 1995, 'The application of IDDX test strategies in analogue and mixed signal IC's', Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France, 20/06/95 - 22/06/95.

APA

Richardson, A., Bratt, A., Baturone, I., & HUERTAS, J. L. (1995). The application of IDDX test strategies in analogue and mixed signal IC's. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Vancouver

Richardson A, Bratt A, Baturone I, HUERTAS JL. The application of IDDX test strategies in analogue and mixed signal IC's. 1995. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Author

Richardson, Andrew ; Bratt, Adrian ; Baturone, I et al. / The application of IDDX test strategies in analogue and mixed signal IC's. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Bibtex

@conference{5986adeb915b45e3849a2a869c4b93eb,
title = "The application of IDDX test strategies in analogue and mixed signal IC's",
abstract = "Supply Current Testing (IDDQ) has become an important defect oriented teststrategy for digital IC products. The technique takes advantage of the lowquiescent supply current drawn by static CMOS circuits relative to thecurrent consumption during state changes. However, in analogue andmixed signal IC{\textquoteright}s this condition can rarely be observed, as in most circuits,steady state currents depend on the biasing conditions and the circuitdesign.This paper reviews analogue current monitoring proposals, investigatessome of the problems related to the use of these techniques and attempts tocategorise a number of analogue design styles against the probablesuitability for current testing methodologies.",
keywords = "analogue test, IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing, mixed signal test",
author = "Andrew Richardson and Adrian Bratt and I Baturone and HUERTAS, {J L}",
year = "1995",
month = jun,
day = "22",
language = "English",
note = "IEEE International Mixed Signal Test Workshop ; Conference date: 20-06-1995 Through 22-06-1995",

}

RIS

TY - CONF

T1 - The application of IDDX test strategies in analogue and mixed signal IC's

AU - Richardson, Andrew

AU - Bratt, Adrian

AU - Baturone, I

AU - HUERTAS, J L

PY - 1995/6/22

Y1 - 1995/6/22

N2 - Supply Current Testing (IDDQ) has become an important defect oriented teststrategy for digital IC products. The technique takes advantage of the lowquiescent supply current drawn by static CMOS circuits relative to thecurrent consumption during state changes. However, in analogue andmixed signal IC’s this condition can rarely be observed, as in most circuits,steady state currents depend on the biasing conditions and the circuitdesign.This paper reviews analogue current monitoring proposals, investigatessome of the problems related to the use of these techniques and attempts tocategorise a number of analogue design styles against the probablesuitability for current testing methodologies.

AB - Supply Current Testing (IDDQ) has become an important defect oriented teststrategy for digital IC products. The technique takes advantage of the lowquiescent supply current drawn by static CMOS circuits relative to thecurrent consumption during state changes. However, in analogue andmixed signal IC’s this condition can rarely be observed, as in most circuits,steady state currents depend on the biasing conditions and the circuitdesign.This paper reviews analogue current monitoring proposals, investigatessome of the problems related to the use of these techniques and attempts tocategorise a number of analogue design styles against the probablesuitability for current testing methodologies.

KW - analogue test

KW - IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing

KW - mixed signal test

M3 - Conference paper

T2 - IEEE International Mixed Signal Test Workshop

Y2 - 20 June 1995 through 22 June 1995

ER -