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  • SANER2018-J1C2_paper_4

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The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract)

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

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The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract). / Kirbas, Serkan; Caglayan, Bora; Hall, Tracy et al.
25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. p. 471.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Kirbas, S, Caglayan, B, Hall, T, Counsell, S, Bowes, D, Sen, A & Bener, A 2018, The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract). in 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., pp. 471, 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018, Campobasso, Italy, 20/03/18. https://doi.org/10.1109/SANER.2018.8330237

APA

Kirbas, S., Caglayan, B., Hall, T., Counsell, S., Bowes, D., Sen, A., & Bener, A. (2018). The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract). In 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings (pp. 471). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SANER.2018.8330237

Vancouver

Kirbas S, Caglayan B, Hall T, Counsell S, Bowes D, Sen A et al. The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract). In 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. p. 471 doi: 10.1109/SANER.2018.8330237

Author

Kirbas, Serkan ; Caglayan, Bora ; Hall, Tracy et al. / The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract). 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 471

Bibtex

@inproceedings{f16d8c86fcd14e22ba96d0f9ea6027fa,
title = "The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract)",
abstract = "In this study, we investigate the effect of EC on the defect-proneness of large industrial software systems and explain why the effects vary.",
author = "Serkan Kirbas and Bora Caglayan and Tracy Hall and Steve Counsell and David Bowes and Alper Sen and Ayse Bener",
note = "{\textcopyright}2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.; 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 ; Conference date: 20-03-2018 Through 23-03-2018",
year = "2018",
month = apr,
day = "2",
doi = "10.1109/SANER.2018.8330237",
language = "English",
pages = "471",
booktitle = "25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

RIS

TY - GEN

T1 - The relationship between evolutionary coupling and defects in large industrial software (journal-first abstract)

AU - Kirbas, Serkan

AU - Caglayan, Bora

AU - Hall, Tracy

AU - Counsell, Steve

AU - Bowes, David

AU - Sen, Alper

AU - Bener, Ayse

N1 - ©2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

PY - 2018/4/2

Y1 - 2018/4/2

N2 - In this study, we investigate the effect of EC on the defect-proneness of large industrial software systems and explain why the effects vary.

AB - In this study, we investigate the effect of EC on the defect-proneness of large industrial software systems and explain why the effects vary.

U2 - 10.1109/SANER.2018.8330237

DO - 10.1109/SANER.2018.8330237

M3 - Conference contribution/Paper

AN - SCOPUS:85050939768

SP - 471

BT - 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 25th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2018

Y2 - 20 March 2018 through 23 March 2018

ER -