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    Rights statement: Copyright 2020 American Institute of Physics. The following article appeared in Applied Physics Letters, 116, (2), 2020 and may be found at http://dx.doi.org/10.1063/1.5135644 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping

Research output: Contribution to Journal/Magazine › Journal article › peer-review

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Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping. / Lin, Hungyen; Burton, Oliver; Engelbrecht, Sebastian et al.
In: Applied Physics Letters, Vol. 116, No. 2, 021105, 13.01.2020.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Lin, H, Burton, O, Engelbrecht, S, Tybussek, K-H, Fischer, BM & Hofmann, S 2020, 'Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping', Applied Physics Letters, vol. 116, no. 2, 021105. https://doi.org/10.1063/1.5135644

APA

Lin, H., Burton, O., Engelbrecht, S., Tybussek, K-H., Fischer, B. M., & Hofmann, S. (2020). Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping. Applied Physics Letters, 116(2), Article 021105. https://doi.org/10.1063/1.5135644

Vancouver

Lin H, Burton O, Engelbrecht S, Tybussek K-H, Fischer BM, Hofmann S. Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping. Applied Physics Letters. 2020 Jan 13;116(2):021105. doi: 10.1063/1.5135644

Author

Lin, Hungyen ; Burton, Oliver ; Engelbrecht, Sebastian et al. / Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping. In: Applied Physics Letters. 2020 ; Vol. 116, No. 2.

Bibtex

@article{06324c33aa9845f99ddf2995e05cc7c5,
title = "Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping",
abstract = "We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.",
author = "Hungyen Lin and Oliver Burton and Sebastian Engelbrecht and Kai-Henning Tybussek and Fischer, {Bernd M.} and Stephan Hofmann",
note = "Copyright 2020 American Institute of Physics. The following article appeared in Applied Physics Letters, 116, (2), 2020 and may be found at http://dx.doi.org/10.1063/1.5135644 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. ",
year = "2020",
month = jan,
day = "13",
doi = "10.1063/1.5135644",
language = "English",
volume = "116",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Inc.",
number = "2",

}

RIS

TY - JOUR

T1 - Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping

AU - Lin, Hungyen

AU - Burton, Oliver

AU - Engelbrecht, Sebastian

AU - Tybussek, Kai-Henning

AU - Fischer, Bernd M.

AU - Hofmann, Stephan

N1 - Copyright 2020 American Institute of Physics. The following article appeared in Applied Physics Letters, 116, (2), 2020 and may be found at http://dx.doi.org/10.1063/1.5135644 This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

PY - 2020/1/13

Y1 - 2020/1/13

N2 - We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.

AB - We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.

U2 - 10.1063/1.5135644

DO - 10.1063/1.5135644

M3 - Journal article

VL - 116

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 2

M1 - 021105

ER -