Standard
THz time-domain spectroscopy uncertainties. /
Lin, Hungyen; Withayachumnankul, W.; Fischer, Bernd M. et al.
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on. IEEE, 2007. p. 222-223.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Lin, H, Withayachumnankul, W, Fischer, BM, Mickan, SP & Abbott, D 2007,
THz time-domain spectroscopy uncertainties. in
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on. IEEE, pp. 222-223.
https://doi.org/10.1109/ICIMW.2007.4516470
APA
Lin, H., Withayachumnankul, W., Fischer, B. M., Mickan, S. P., & Abbott, D. (2007).
THz time-domain spectroscopy uncertainties. In
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on (pp. 222-223). IEEE.
https://doi.org/10.1109/ICIMW.2007.4516470
Vancouver
Lin H, Withayachumnankul W, Fischer BM, Mickan SP, Abbott D.
THz time-domain spectroscopy uncertainties. In Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on. IEEE. 2007. p. 222-223 doi: 10.1109/ICIMW.2007.4516470
Author
Lin, Hungyen ; Withayachumnankul, W. ; Fischer, Bernd M. et al. /
THz time-domain spectroscopy uncertainties. Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on. IEEE, 2007. pp. 222-223
Bibtex
@inproceedings{580625e593b2476f8697d61c292beade,
title = "THz time-domain spectroscopy uncertainties",
abstract = "THz time-domain spectroscopy (TDS) is a significant technique for material characterization as it seeks to determine the optical or dielectric constants in the T-ray regime. The precision of the constants is highly affected by the intricate THz-TDS process. Typically, a short-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision and therefore has an effect on the uncertainty of the achieved optical or dielectric constants. This paper analyses sources of uncertainty and models error propagation through the system.",
author = "Hungyen Lin and W. Withayachumnankul and Fischer, {Bernd M.} and Mickan, {S. P.} and Derek Abbott",
year = "2007",
doi = "10.1109/ICIMW.2007.4516470",
language = "English",
isbn = "9781424414383 ",
pages = "222--223",
booktitle = "Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on",
publisher = "IEEE",
}
RIS
TY - GEN
T1 - THz time-domain spectroscopy uncertainties
AU - Lin, Hungyen
AU - Withayachumnankul, W.
AU - Fischer, Bernd M.
AU - Mickan, S. P.
AU - Abbott, Derek
PY - 2007
Y1 - 2007
N2 - THz time-domain spectroscopy (TDS) is a significant technique for material characterization as it seeks to determine the optical or dielectric constants in the T-ray regime. The precision of the constants is highly affected by the intricate THz-TDS process. Typically, a short-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision and therefore has an effect on the uncertainty of the achieved optical or dielectric constants. This paper analyses sources of uncertainty and models error propagation through the system.
AB - THz time-domain spectroscopy (TDS) is a significant technique for material characterization as it seeks to determine the optical or dielectric constants in the T-ray regime. The precision of the constants is highly affected by the intricate THz-TDS process. Typically, a short-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision and therefore has an effect on the uncertainty of the achieved optical or dielectric constants. This paper analyses sources of uncertainty and models error propagation through the system.
U2 - 10.1109/ICIMW.2007.4516470
DO - 10.1109/ICIMW.2007.4516470
M3 - Conference contribution/Paper
SN - 9781424414383
SP - 222
EP - 223
BT - Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
PB - IEEE
ER -
